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Search Publications

NIST Authors in Bold

Displaying 1 - 25 of 2534

Multi'omic Characterization of Human Whole Stool RGTMs

September 8, 2023
Author(s)
Amanda L. Bayless, Sandra M. Da Silva, Clay Davis, Abraham Kuri Cruz, Tracey Schock, Stephanie Servetas, Paulina Piotrowski
The gut microbiome plays a critical role in a vast and disparate set of health and disease states, including cancer and obesity. Human fecal is a complex mixture including microbes, proteins, undigested plant matter and fat content according to the diet

Quantifying the Effect of Guest Binding on Host Environment

August 29, 2023
Author(s)
Angela Stelson, Zack Fishman, Jacob Pawlik, Gosia Musial, Jim Booth, Chris Long, Kathleen Schwarz, Nate Orloff, Hugh Ryan, Angela Grommet, Jonathan Nitschke, Felix Rizzuto
The environment around a host-guest complex is defined by of intermolecular interactions between solvent molecules and counter ions. These interactions govern both the solubility of these complexes and the rates of reactions confined within them11. Such

National Institute of Standards and Technology Environmental Scan 2023: Societal and Technology Landscape to Inform Science and Technology Research

August 23, 2023
Author(s)
Ashley Boggs-Russell, Kerrianne Buchanan, David W. Griffith, Heather Evans, Dimitrios Meritis, Lisa Ng, Anna Sberegaeva, Michelle Stephens
The 2023 National Institute of Standards and Technology Environmental Scan provides an analysis of key external factors that could impact NIST and the fulfillment of its mission in coming years. The analyses were conducted through three separate lenses

An Evolving Regulatory Landscape for Commercial Electric Vehicle Fueling

August 22, 2023
Author(s)
Tina G. Butcher, Michael Nelson
Plug-in electric vehicles (PEV), which include "all-electric" battery EV (BEV) and plug-in hybrid EV (PHEV), comprise a rapidly growing proportion of the U.S. automobile market – nearly 8% of all light-duty vehicles sold in Oct. 2022, a 41.4% rise over

Fabrication of Specimens for Atom Probe Tomography using a Combined Gallium and Neon Focused Ion Beam Milling Approach

August 16, 2023
Author(s)
Frances Allen, Paul Blanchard, David Pappas, Russell Lake, Deying Xia, John Notte, Ruopeng Zhang, Andrew Minor, Norman A. Sanford
We demonstrate a new focused ion beam sample preparation method for atom probe tomography. The key aspect of the new method is that we use a neon ion beam for the final tip shaping after conventional annulus milling using gallium ions. This dual-ion

Measuring the permittivity tensor of anisotropic DyScO3 to 110 GHz

August 14, 2023
Author(s)
Florian Bergmann, Meagan Papac, Nick Jungwirth, Bryan Bosworth, Tomasz Karpisz, Anna Osella, Lucas Enright, Eric Marksz, Angela Stelson, Chris Long, Nate Orloff
DyScO3 (DSO) is an attractive substrate on which to grow epitaxial thin films with extraordinary materials physics. However, its highly anisotropic permittivity makes some measurements exceedingly difficult: For instance, its permittivity tensor has not

Recommendations for Setting a Criterion for Assessing Commutability of Secondary Calibrator Certified Reference Materials

August 11, 2023
Author(s)
W. Greg Miller, Thomas Keller, Jeffrey Budd, Jesper Johansen, Mauro Panteghini, Neil Greenberg, Vincent Delatour, Ferruccio Ceriotti, Robert Rej, Johanna Camara, Liesbet Deprez, Finlay MacKenzie, Alicia Lyle, Eline van der Hagen, Chris Burns, Pernille Fauskanger, Sverre Sandberg
A secondary higher-order calibrator is required to be commutable with clinical samples to be suitable for use in the calibration hierarchy of an end-user clinical laboratory in vitro diagnostic medical device (IVD-MD). Commutability is a property of a

Accurate measurement of the loss rate of cold atoms due to background gas collisions for the quantum-based cold atom vacuum standard

August 1, 2023
Author(s)
Daniel Barker, James A. Fedchak, Jacek Klos, Julia Scherschligt, Abrar Sheikh, Eite Tiesinga, Stephen Eckel
We present measurements of thermalized collisional rate coefficients for ultra-cold $^7$Li and $^87}$Rb colliding with room-temperature He, Ne, N$_2$, Ar, Kr, and Xe. In our experiments, a combined flowmeter and dynamic expansion system, a vacuum metrology

2023 NIST OWM S&T Analysis

July 7, 2023
Author(s)
Lisa Warfield, Loren Minnich, Jan Konijnenburg, Gloria Diane Lee, Juana Williams
The NIST OWM Analysis is submitted to assist the Weights and Measures community as it deliberates on items before the 2023 NCWM Annual Conference. NIST OWM offers these comments and recommendations based upon information and input available as of the date

2023 OWM Annual Analysis

July 6, 2023
Author(s)
John McGuire, Lisa Warfield
The NIST OWM Analysis is submitted to assist the Weights and Measures community as it deliberates on items before the Conference. NIST OWM offers these comments and recommendations based upon information and input available as of the date of this report.

Operando photoelectron spectromicroscopy of nanodevices: Correlating the surface chemistry and transport in SnO2 nanowire chemiresistors

June 29, 2023
Author(s)
Andrei Kolmakov, Trey Diulus, Kurt D. Benkstein, Stephen Semancik, Majid Kazemian, Matteo Amati, Maya Kiskinova, Luca Gregoratti
With size reduction of active elements in microelectronics to tens of nanometers and below, the effect of surface and interface properties on overall device performance becomes crucial. High resolution spectroscopic and imaging techniques provide a

Laser tracker interim testing per the ASME B89.4.19-2021 and ISO 10360-10:2021 standards

June 28, 2023
Author(s)
Marcos Motta de Souza, Bala Muralikrishnan, Vincent Lee, Daniel S. Sawyer
The recently revised ASME B89.4.19-2021 and ISO 10360-10:2021 standards for laser trackers include a new interim test that is comprehensive and more sensitive to systematic errors than the interim tests in the previous versions of the standards, i.e., the

2022 NIST Summary of U.S. Legal Metrology Activities

June 20, 2023
Author(s)
Lisa Warfield, Tina G. Butcher, Richard A. Harshman, Jan Konijnenburg, Gloria Diane Lee, David Sefcik, Juana Williams, Katrice Lippa
The NIST Office of Weights and Measures (OWM) presents its first report 2022 NIST Annual Summary of U.S. Legal Metrology Activities report. This report includes a summary of changes made to NIST Handbook 44 (2021) Specifications, Tolerances and Other

Reference Isotherms for Water Vapor Sorption on Nanoporous Carbon: Results of an Interlaboratory Study

May 26, 2023
Author(s)
Huong Giang Nguyen, Blaza Toman, Roger D. van Zee, Carsten Prinz, Matthias Thommes, Riaz Ahmad, David Kiska, Jamie Salinger, Ian Walton, Krista Walton, Darren Broom, Mike Benham, Humera Ansari, Ronny Pini, Camille Petit, Jurgen Adolphs, Andreas Schreiber, Toshihiro Shigeoka, Yuko Konishi, Kazuyuki Nakai, Matthias Henninger, Thomas Petrzik, Can Kececi, Vladimir Martis, Thomas Pasche, Enzo Mangano, Stefano Brandani

The design and performance of an electronic torque standard directly traceable to the revised SI

May 25, 2023
Author(s)
Zane Comden, John-Edward Draganov, Stephan Schlamminger, Frank Seifert, Charles Waduwarage Perera, David B. Newell, Leon Chao
The United States National Institute of Standards and Technology (NIST) has been developing a new device for primary standard realization of torque utilizing established trace- ability to the quantum-electrical International System of Units (SI) standards

Nonlinear Networks for Arbitrary Optical Synthesis

May 19, 2023
Author(s)
Jennifer Black, Zachary Newman, Su-Peng Yu, David Carlson, Scott Papp
Nonlinear wavelength conversion is a powerful control of light, especially when implemented at the nanoscale with integrated photonics. However, strict energy conservation and phase-matching requirements constrain the converted output. To overcome these

Reflective deep-ultraviolet Fourier ptychographic microscopy for nanoscale imaging

April 29, 2023
Author(s)
Kwanseob Park, Yoon Sung Bae, Sang-Soo Choi, Martin Sohn
Fourier ptychographic microscopy (FPM) that has high space-bandwidth-product and phase imaging capability requires significant resolution enhancement in reflection mode for imaging of nanoscale semiconductor devices. A direct way to nanoscale resolution is

NeuroBench: advancing neuromorphic computing through collaborative, fair and representative benchmarking

April 20, 2023
Author(s)
Jason Yik, Soikat Hasan Ahmed, Zergham Ahmed, Brian Anderson, Andreas G. Andreou, Chiara Bartolozzi, Arindam Basu, Douwe den Blanken, Petrut Bogdan, Sonia Buckley, Sander Bohte, Younes Bouhadjar, Gert Cauwenberghs, Federico Corradi, Guido de Croon, Andreea Danielescu, Anurag Daram, Mike Davies, Yigit Demirag, Jason K. Eshraghian, Jeremy Forest, Steve Furber, Michael Furlong, Aditya Gilra, Giacomo Indiveri, Siddarth Joshi, Vedant Karia, Lyes Khacef, James C. Knight, Laura Kriener, Rajkumar Kubendran, Dhireesha Kudithipudi, Gregor Lenz, Rajit Manohar, Christian Mayr, Konstantinos Michmizos, Dylan Muir, Emre Neftci, Thomas Nowotny, Fabrizio Ottati, Ayca Ozcelikkale, Noah Pacik-Nelson, Priyadarshini Panda, Sun Pao-Sheng, Melika Payvand, Christian-Gernot Pehle, Mihai Alexandru Petrovici, Cristoph Posch, Alpha Renner, Yulia Sandamirskaya, Clemens Schaefer, Andre van Schaik, Johannes Schemmel, Catherine Schuman, Jae-sun Seo, Sumit Bam Shrestha, Manolis Sifalakis, Amos Sironi, Kenneth Stewart, Terrence Stewart, Philipp Stratmann, Guangzhi Tang, Jonathan Timcheck, Marian Verhelst, Craig Vineyard, Bernard Vogginger, Amirreza Yousefzadeh, Biyan Zhou, Fatima Tuz Zohora, Charlotte Frenkel, Vijay Janapa Reddy
The field of neuromorphic computing holds great promise in terms of advancing computing efficiency and capabilities by following brain-inspired principles. However, the rich diversity of techniques employed in neuromorphic research has resulted in a lack
Displaying 1 - 25 of 2534