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Displaying 45776 - 45800 of 74220

Analysis of dimensional metrology standards:

January 1, 2001
Author(s)
John Evans, Simon Frechette, John Horst, Hui Huang, Thomas Kramer, Elena Messina, Fred Proctor, Bill Rippey, Harry Scott, Ted Vorburger, Al Wavering

Anomalous Modes Underpin Vortex Dynamics in Confined Bose-Einstein Condensates

January 1, 2001
Author(s)
D L. Feder, A A. Svidzinsky, A L. Fetter, Charles W. Clark
The dynamics of vortices in trapped Bose-Einstein condensates are investigated both analytically and numerically. In axially symmetric traps, the critical rotation frequency for metasability of an isolated vortex coincides with the largest vortex

Antibody-Antigen Adhesion Studies Using Optical Tweezers

January 1, 2001
Author(s)
S Kulin, Rani B. Kishore, Kristian Helmerson, Joseph B. Hubbard
Multivalent molecular adhesion processes play a key role in a wide variety of biological phenomena, such as immune response, infections, as well as cellular migration, communication, and differentiation. In many cases adhesion is mediated by interactions

Apparatus for Screening Fire Suppression Efficiency of Dispersed Liquid Agents.

January 1, 2001
Author(s)
Jiann C. Yang, Michelle K. Donnelly, N C. Prive, William L. Grosshandler
This paper is an abridged version of NISTIR 6319. The design, construction, demonstration, and operation of a bench-scale device capable of screening the fire suppression efficiency of liquid agents are described in detail in this report. The apparatus is

Apparatus for Screening Fire Suppression Efficiency of Dispersed Liquid Agents.

January 1, 2001
Author(s)
Jiann C. Yang, Michelle K. Donnelly, William L. Grosshandler, N C. Prive
This paper is an abridged version of NISTIR 6319. The design, construction, demonstration, and operation of a bench-scale device capable of screening the fire suppression efficiency of liquid agents are described in detail in this report. The apparatus is

Aspects of Practical Radiometry: Terminology, Uncertainty, and Physical Optics

January 1, 2001
Author(s)
Eric L. Shirley, Raju V. Datla
We discuss efforts that have been made to help establish-in practice-a greater uniformity of nomenclature used for various terms in radiometry as well as expression of measurement uncertainty. We also discuss the role of diffraction effects, which account

Atomic Level Surface Metrology

January 1, 2001
Author(s)
Theodore V. Vorburger, Ronald G. Dixson, Jun-Feng Song, Thomas Brian Renegar, Joseph Fu, Ndubuisi George Orji, V W. Tsai, E. C. Williams, H Edwards, D Cook, P West, R Nyffenegger
MotivationSemiconductor wafers and many types of optical elementsrequire ultra-smooth surfaces in order to functionas specifiedExamples:Laser gyro mirrors with rms roughness 0.1 nmSilicon gate oxides with thickness 3 nm,rms roughness must be significantly
Displaying 45776 - 45800 of 74220