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NIST Authors in Bold

Displaying 33901 - 33925 of 74372

Two Simple Tests for Models of Current-Induced Magnetization Switching

January 1, 2007
Author(s)
N Theodoropoulou, Abhishek Sharma, W Pratt, Mark D. Stiles, J Xiao, J Bass
We describe two simple tests for models of current-induced magnetization switching due to spin-transfer-torque in ferromagnetic/non-magnetic/ferromagnetic (F/N/F) trilayers. The first involves comparing calculated and measured values of the ratio X = ?I(Cu

Verification of a gas mask calibrant:

January 1, 2007
Author(s)
Robert Fletcher, George Mulholland, Jiann Yang, Lance King, Michael Winchester, Donna Klinedinst, Jennifer Verkouteren, David Buckingham, Thomas Cleary, James Filliben

Wetting Behavior on Microscale Wrinkled Surfaces

January 1, 2007
Author(s)
Jun Y. Chung, Christopher M. Stafford
We present a systematic study of the wetting behavior on the anisotropic microstructure having a simple sinusoidal profile. The micro-patterned surface was generated by using the buckling-based technique, and its wetting properties were examined by contact

Widefield Light Microscopy Method for High Resolution and Quantum Dot Spectral Studies

January 1, 2007
Author(s)
Cynthia J. Zeissler, Keana C. Scott, Richard D. Holbrook, Peter E. Barker, Yan Xiao
We are exploring methods to achieve 3D 200 nm resolution multispectral imaging with an ordinary inexpensive widefield microscope using incoherent white light sources and an electronically tunable filter. In this work, the capabilities were applied to

Will Future Measurement Needs for the Semiconductor Industry Be Met?

January 1, 2007
Author(s)
Herbert S. Bennett, Alain C. Diebold, C. M. Garner
We present an assessment of the state of the nation''s measurement system in its ability to meet the metrology needs of the semiconductor industry. Lacking an acceptable metric for the assessing the health of metrology for the semiconductor industry, we

Electromagnetics Division: Programs, Activities, and Accomplishments

December 31, 2006
Author(s)
Ronald B. Goldfarb
The Electromagnetics Division is a critical national resource for a wide range of customers. U.S. industry is the primary customer both for the division's measurement services and for technical support on the test and measurement methodology necessary for

Role-Based Access Control, Second Edition

December 31, 2006
Author(s)
David Ferraiolo, David Kuhn, Ramaswamy Chandramouli
[ISBN-13: 978-1-59693-113-8] This newly revised edition of "Role-Based Access Control" offers the latest details on a security model aimed at reducing the cost and complexity of security administration for large networked applications. The second edition

A practical guide to the CIF:usability measurements

December 29, 2006
Author(s)
Mary F. Theofanos, Brian C. Stanton, Nigel Bevan
Using the Common Industry Format ( CIF) to specify usability measures can positively influence the development process. The CIF remains inherently flexible and adaptable?empowering the practitioner to identify success criteria specific to the application
Displaying 33901 - 33925 of 74372
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