Two Simple Tests for Models of Current-Induced Magnetization Switching

Published

January 1, 2007

Author(s)

N Theodoropoulou, Abhishek Sharma, W Pratt, Mark D. Stiles, J Xiao, J Bass

Abstract

We describe two simple tests for models of current-induced magnetization switching due to spin-transfer-torque in ferromagnetic/non-magnetic/ferromagnetic (F/N/F) trilayers. The first involves comparing calculated and measured values of the ratio X = ?I(Cu)/?I(CuGe), where ?I = I+ - I-, the difference between switching currents for + and - current directions, when only the N-layer is changed from Cu to a dilute CuGe alloy. The Ge in Cu causes a large increase in elastic scattering (large reduction in mean-free-path), but only a smaller increase in spin-orbit scattering (leaving the spin-diffusion length still relatively long). The second involves comparing calculated and measured values of the ratios (I+/I-) for both Cu and CuGe. Unexpectedly, the most sophisticated models generally fit the first ratio least well at both 295 K and 4.2 K. None of the models agree with the ratio (I+/I- ).

Citation

Journal of Applied Physics

Pub Type

Journals

Keywords

MODEL

Citation

Theodoropoulou, N. , Sharma, A. , Pratt, W. , Stiles, M. , Xiao, J. and Bass, J. (2007), Two Simple Tests for Models of Current-Induced Magnetization Switching, Journal of Applied Physics (Accessed October 22, 2025)