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Displaying 16326 - 16350 of 73892

Use of the Bethe Equation for Inner-Shell Ionization by Electron Impact

May 13, 2016
Author(s)
Cedric J. Powell, Xavier Llovet, Francesc Salvat
We analyzed calculated cross sections for K-, L-, and M-shell ionization by electron impact to determine the energy ranges over which these cross sections are consistent with the Bethe equation for inner-shell ionization. Our analysis was performed with K

Combinatorial Testing for Cybersecurity and Reliability

May 12, 2016
Author(s)
David R. Kuhn, Raghu N. Kacker, Larry Feldman, Gregory A. Witte
This bulletin focuses on NIST's combinatorial testing work. Combinatorial testing is a proven method for more effective software testing at lower cost. The key insight underlying combinatorial testing's effectiveness resulted from a series of studies by

Electrical Units in the New SI: Saying Goodbye to the 1990 Values

May 12, 2016
Author(s)
Nick Fletcher, Gert Rietveld, James K. Olthoff, Ilya F. Budovsky
The proposed redefinition of several SI base units is a topic that has been on the metrology agenda for the last decade. The general principles and the motivation for the changes have been presented at the NCSLI several times. However, recent progress on

Elemental Sulfur and Molybdenum Disulfide Composites for Li-S Batteries with Long Cycle Life and High-Rate Capability

May 12, 2016
Author(s)
Vladimir P. Oleshko, Christopher L. Soles, Philip T. Dirlam, Jungjin Park, Adam G. Simmonds, Kenneth Domanik, Kookheon Char, Richard Glass, Nicola Pinna, Yung-Eun Sung
The development of next-generation battery systems beyond Li-ion technology remains a crucial challenge in accommodating the evolving energy storage demands presented by electric vehicles and efficient storage of energy from intermittent renewable sources

Pattern-Directed Phase Separation of Polymer-Grafted Nanoparticles in a Homopolymer Matrix

May 12, 2016
Author(s)
Ren Zhang, Bongjoon Lee, Michael R. Bockstaller, Sanat K. Kumar, Christopher Stafford, Jack F. Douglas, Dharmaraj Raghavan, Alamgir Karim
The controlled organization of nanoparticle (NP) constituents into superstructures of well- defined shape, composition and connectivity represents a continuing challenge in the development of novel hybrid materials for many technological applications. We

Combinatorial Coverage Analysis of Subsets of the TLS Cipher Suite Registry

May 11, 2016
Author(s)
Dimitris Simos, Kristoffer Kleine, D. Richard Kuhn, Raghu N. Kacker
We present a combinatorial coverage measurement for (subsets) of the TLS cipher suite registries by analyzing the specified ciphers of IANA, ENISA, BSI, Mozilla and NSA Suite B. Our findings contribute towards the design of quality measures of recommended

Uncertainty of Error: The Error Dilemma

May 11, 2016
Author(s)
Charles D. Ehrlich
Measurement error has historically been defined in the metrology community as a difference of 'values,' usually as a difference between a 'measured value' and a 'reference value.' The reference value is sometimes considered to be a 'true value,' which is

Enhancing Single-Wall Carbon Nanotube Properties Through Controlled Endohedral Filling

May 10, 2016
Author(s)
Jochen I. Campo, Yanmei Piao, Stephanie Lam, Christopher Stafford, Jason K. Streit, Jeffrey R. Simpson, Angela R. Hight Walker, Jeffrey Fagan
Chemical control of the endohedral volume of single-wall carbon nanotubes (SWCNTs) via liquid-phase filling is demonstrated to be a facile strategy to controllably modify properties of the nanotubes in manners significant for processing and proposed

National Voluntary Laboratory Accreditation Program (NVLAP) Calibration Laboratories

May 10, 2016
Author(s)
Barbara J. Belzer, Kari K. Harper, Thomas R. Hettenhouser, Warren R. Merkel
NIST Handbook 150-2, 2016 edition, presents the technical requirements and guidance for the accreditation of laboratories under the National Voluntary Laboratory Accreditation Program (NVLAP) Calibration Laboratories Program. The 2016 edition of NIST

Real-Time, Single Molecule Electronic DNA Sequencing by Synthesis Using Polymer Tagged Nucleotides on a Nanopore Array

May 10, 2016
Author(s)
Carl Fuller, Shiv Kumar, Mintu Porel, Michen Chien, Arek Bibillo, P. B. Stranges, Michael Dorwart, Chuanjua Tao, Zengmin Li, Wenjing Guo, Shundi Shi, Daniel Korenblum, Andrew Trans, Anne Aguirre, Edward Liu, Takeshi Harada, James Pollard, Ashwini Bhat, Cynthia Cech, Alexander Yang, Cleoma Spilman, Mirko Palla, Jennifer Hovis, Roger Chen, Irina Morozova, Sergey Kalachikov, James Russo, John J. Kasianowicz, Stefan Roever, George Church, Jingyue Ju
DNA sequencing by synthesis (SBS) offers a robust platform to decipher nucleic acid sequences. Recently, we developed a single molecule nanopore-based SBS strategy (NanoSBS) that accurately distinguishes four bases by electronically detecting and

Stress Analysis of Conical Contact Joints in the NIST 4.45 MN Deadweight Machine

May 10, 2016
Author(s)
Nicholas A. Vlajic, Akobuije D. Chijioke, Ricky L. Seifarth
Structural analysis of conical contact joints in the NIST 4.45 MN Dead Weight Machine using finite element analysis is presented in this paper. This analysis was undertaken due to the observation of surface damage in these joints. Parametric studies are

Synthesis, Fabrication, and Heterostructure of Charged, Substituted Polystyrene Multilayer Dielectrics and Their Effects in Pentacene Transistors

May 10, 2016
Author(s)
Olivia J. Alley, Evan Plunkett, Tejaswini S. Kale, Xin Guo, Grace McClintock, Manasa Bhupathiraju, Brian Kirby, Daniel H. Reich, Howard E. Katz
Charge trapping and storage in polymer dielectric can be harnessed for the control of semiconductor device behavior, including organic transistors. For example, gate insulators chosen for organic transistors have an important effect on both bias stress

Automating Robot Planning using Product and Manufacturing Information

May 9, 2016
Author(s)
Frederick M. Proctor, Gijs van der Hoorn, Robert R. Lipman
Advances in sensing, modeling, and control have made it possible to increase the accuracy of robots, and enable them to perform in dynamic environments. Often, performance deficiencies are not evident until late in the development of the manufacturing

Comparison of T1 measurement using ISMRM/NIST system phantom

May 9, 2016
Author(s)
Kathryn E. Keenan, Karl F. Stupic, Michael A. Boss, Stephen E. Russek, Thomas L. Chenevert, Pottumarthi V. Prasad, Wilburn E. Reddick, Jie Zheng, Peng Hu, Edward F. Jackson
We used the ISMRM/NIST system phantom to assess variations of T1 measurements across MRI systems at 1.5 T and 3 T, to determine the repeatability and reproducibility of the T1 measurements. This study demonstrates that T1 variations from NMR-measured value
Displaying 16326 - 16350 of 73892
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