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Stability of Single Electron Devices: Charge Offset Drift

Published

Author(s)

Michael D. Stewart, Neil M. Zimmerman

Abstract

Abstract: Single electron devices (SEDs) afford the opportunity to isolate and manipulate individual electrons. This ability imbues SEDs with potential applications in a wide array of areas from metrology (current and capacitance) to quantum information. Success in each application ultimately requires exceptional performance, uniformity, and stability from SEDs which is currently unavailable. In this review, we discuss a time instability of SEDs which occurs at low frequency (
Citation
Applied Sciences

Keywords

single electron devices, charge offset drift, stability, integration, drift

Citation

Stewart, M. and Zimmerman, N. (2016), Stability of Single Electron Devices: Charge Offset Drift, Applied Sciences, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=920969 (Accessed August 10, 2022)
Created June 29, 2016, Updated February 19, 2017