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Displaying 32201 - 32225 of 74219

Frequency Uncertainty for Optically Referenced Femtosecond Laser Frequency Combs

February 1, 2007
Author(s)
Long-Sheng Ma, Zhiyi Bi, A Bartels, Kyoungsik Kim, Lennart Robertsson, Massimo Zucco, Robert Windeler, G Wilpers, Christopher W. Oates, Leo W. Hollberg, Scott Diddams
We present measurements and analysis of the currently known residual frequency uncertainty of femtosecond laser frequency combs (FLFCs) based on Kerr-lens mode-locked Ti:sapphire lasers. Broadband frequency combs generated directly from the laser

Localized Residential Fire Suppression Systems (NIST SP 1006)

February 1, 2007
Author(s)
Daniel M. Madrzykowski
A Presentation by Daniel Madrzykowski. Localized Residential Fire Suppression Systems: -Kitchen fire hazard characterization. -Investigate "passive" and "active" fire protection systems. -Full-scale demonstrations/evaluations.

Low timing jitter detector for gigahertz quantum key distribution

February 1, 2007
Author(s)
Robert J. Collins, Robert Hadfield, Veronica Fernandez, Sae Woo Nam, Gerald S. Buller
A superconducting single-photon detector based on a niobium nitride nanowire is demonstrated in an optical-fibre-based quantum key distribution test bed operating at a clock rate of 3.3 GHz and a transmission wavelength of 850 nm. The low jitter of the

Molecular Dynamics Calculations of the Viscosity of Xenon Gas

February 1, 2007
Author(s)
Raymond D. Mountain
The density variation of the viscosity of xenon gas is determined using molecular dynamics simulation with a semi-empirical pair potential fit to low density gas properties. The gas states ranged in density from 48.4 kg m-3 to 999 kg m-3 and varied in

NCMC Workshop ReportNCMC-10: Persistent Challenges in Combinatorial Materials Science

February 1, 2007
Author(s)
Michael J. Fasolka, Carol E. Laumeier, Kathryn L. Beers, Christopher M. Stafford
Tremendous advances in the development and application of combinatorial and high-throughput methods for materials research have been accomplished over the past 15 years. Despite these accomplishments, today s combinatorial materials science is met by some

NIST Focuses Attention on Clinical Informatics and Healthcare IT Standards

February 1, 2007
Author(s)
Sharon J. Kemmerer
NIST has recently established an institutional membership with the Health Industy Business Communication Council (HIBCC) - the ANSI-accredited standards development organization. HIBCC featured a welcoming article in their Sept-Dec 2005 magazine that

On Capturing Information Requirements in Process Specifications

February 1, 2007
Author(s)
Edward J. Barkmeyer Jr., Peter O. Denno
Historically, business process models refer only to large information sets, and database models and messaging standards provide models of all information about the related business entities that might be used in any of several business processes. In short

Once is Enough in Radiometric Calibrations

February 1, 2007
Author(s)
Gerald T. Fraser, Charles E. Gibson, Howard W. Yoon, Albert C. Parr
The successful development of an Optical Technology Division quality system for optical radiation measurement services has provided the opportunity to reconsider the existing calibration procedures to improve quality and reduce costs. We have instituted

Scanning Advanced Automobile Technology

February 1, 2007
Author(s)
Hamid Gharavi, K V. Prasad, P. Ioannou
The progress of some of the key electrical, electronics, communications, controls and software technologies that enable in-vehicle, vehicle-to-vehicle (V2V) and vehicle-to-infrastructure (V2I) functions is presented, in historical, current & futuristic

Temperature-Controlled Depth Profiling in Poly (methylmethacrylate) (PMMA) Using Cluster Secondary Ion Mass Spectrometry (SIMS) II. An Investigation of Sputter-Induced Topography, Chemical Damage and Depolymerization Effects

February 1, 2007
Author(s)
Christine M. Mahoney, Albert J. Fahey, John G. Gillen, Chang Xu, James Batteas
Secondary Ion Mass Spectrometry (SIMS) employing an SF polyatomic primary ion source was used to depth profile Poly(methyl methacrylate) (PMMA) at a series of temperatures from -75 C to 125 C where the primary glass transition for PMMA occurs at 105 C. The

Temperature-Controlled Depth Profiling in Poly(methylmethacrylate) (PMMA) Using Cluster Secondary Ion Mass Spectrometry (SIMS): I. Investigation of Depth Profile Characteristics

February 1, 2007
Author(s)
Christine M. Mahoney, Albert J. Fahey, John G. Gillen
Secondary Ion Mass Spectrometry (SIMS) employing an SF5+ polyatomic primary ion source was used to depth profile Poly(methyl methacrylate) (PMMA) at a series of temperatures from -75 oC to 125 oC, where the primary glass transition for PMMA occurs at 105

TheoH and Allan Deviation as Power-Law Noise Estimators

February 1, 2007
Author(s)
Jennifer A. Taylor, David A. Howe
A spectral interpretation using the frequency response of the Allan Variance is used to determine slopes of f α noise, commonly called ''power-law noise.'' This paper shows that TheoH provides significantly better determination of f α noise slopes at long
Displaying 32201 - 32225 of 74219