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NIST Authors in Bold

Displaying 51 - 75 of 1275

Size-Dependent Structural Distortions

Michael D. Anderson, Colby L. Heideman, Qiyin Lin, Mary Smeller, Robert S. Kokenyesi, Andrew A. Herzing, Ian M. Anderson, Douglas A. Keszler, Paul Zschack, David C. Johnson
Recently we reported that intergrowth compounds [(MSe)1+y]m(TSe2)n, with M = {Pb, Bi Ce} and T = {W, Nb, Ta} self assemble from designed precursors. The values

Rippling Instability of Supported Polymer Nanolines

Vijaya R. Tirumala, Christopher M. Stafford, Leonidas E. Ocola, Jack F. Douglas, L. Mahadevan
The swelling response of polymer line gratings supported on a rigid substrate has direct implications on their mechanical stability during pattern transfer in

Mechanical Properties of Polymer Nano-Films

Junghyun Lee, Jun Y. Chung, Christopher M. Stafford
Three fundamental mechanical properties of supported glassy polystyrene films with thickness ranging from 250 nm to 9 nm were quantitatively determined by a

PDH-locked, frequency-stabilized cavity ring-down spectrometer

Joseph T. Hodges, A. Cygan, Piotr Maslowski, Katarzyna E. Bielska, S. Wojtewicz, J. Domyslawska, Hisashi Abe, R.S. Trawinski, R. Ciurylo
We describe a high sensitivity and high spectral resolution laser absorption spectrometer based upon the frequency-stabilized cavity ring-down spectroscopy (FS

Certification of Standard Reference Material 660b

David R. Black, Donald A. Windover, Albert Henins, James J. Filliben, James P. Cline
The National Institute of Standards and Technology (NIST) certifies a suite of Standard Reference Materials (SRMs) to address specific aspects of instrument


Robert F. Cook
Abstract. A framework of increasing complexity is developed to describe the mechanics of adhesion and its reverse, de-adhesion or separation, during indentation
Displaying 51 - 75 of 1275