Large Negative Poisson's Ratio for SrTiO3 Thin Films Grown on Si(001
F S. Aguirre-Tostado, A Herrera-Gomez, Joseph Woicik, R Droopad, Z Yu, D G. Schlom, E Karapetrova, P Pianetta, C S. Hellberg
The driving force of the semiconductor industry to integrate thin transition-metal oxides with Si transistor technology has led to the development of SrTiO3 thin-film growth on Si(001). As SrTiO3 represents a large class of oxides with the perovskite structure, it is imperative to understand the fundamental aspects of its thin-film expitaxy and, in particular, any anomalous behavior it may exhibit. X-ray diffraction measurements have discovered a large negative Poisson's ratio for SrTiO3 thin films grown on Si(001). Polarization dependent extended x-ray absorption fine-structure measurements demonstrate that this elastic anomaly is driven by the interfacial polarization of the SrTiO3 layers. First-principles density-functional calculations support these conclusions.
perovskite structure, Poisson's ratio, polarization, SrTiO3 thin films
, Herrera-Gomez, A.
, Woicik, J.
, Droopad, R.
, Yu, Z.
, Schlom, D.
, Karapetrova, E.
, Pianetta, P.
and Hellberg, C.
Large Negative Poisson's Ratio for SrTiO3 Thin Films Grown on Si(001, Nature Materials
(Accessed December 7, 2023)