Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Large Negative Poisson's Ratio for SrTiO3 Thin Films Grown on Si(001



F S. Aguirre-Tostado, A Herrera-Gomez, Joseph Woicik, R Droopad, Z Yu, D G. Schlom, E Karapetrova, P Pianetta, C S. Hellberg


The driving force of the semiconductor industry to integrate thin transition-metal oxides with Si transistor technology has led to the development of SrTiO3 thin-film growth on Si(001). As SrTiO3 represents a large class of oxides with the perovskite structure, it is imperative to understand the fundamental aspects of its thin-film expitaxy and, in particular, any anomalous behavior it may exhibit. X-ray diffraction measurements have discovered a large negative Poisson's ratio for SrTiO3 thin films grown on Si(001). Polarization dependent extended x-ray absorption fine-structure measurements demonstrate that this elastic anomaly is driven by the interfacial polarization of the SrTiO3 layers. First-principles density-functional calculations support these conclusions.
Nature Materials


perovskite structure, Poisson's ratio, polarization, SrTiO3 thin films


Aguirre-Tostado, F. , Herrera-Gomez, A. , Woicik, J. , Droopad, R. , Yu, Z. , Schlom, D. , Karapetrova, E. , Pianetta, P. and Hellberg, C. (2021), Large Negative Poisson's Ratio for SrTiO3 Thin Films Grown on Si(001, Nature Materials (Accessed December 7, 2023)
Created October 12, 2021