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Large Negative Poisson's Ratio for SrTiO3 Thin Films Grown on Si(001

Published

Author(s)

F S. Aguirre-Tostado, A Herrera-Gomez, Joseph Woicik, R Droopad, Z Yu, D G. Schlom, E Karapetrova, P Pianetta, C S. Hellberg

Abstract

The driving force of the semiconductor industry to integrate thin transition-metal oxides with Si transistor technology has led to the development of SrTiO3 thin-film growth on Si(001). As SrTiO3 represents a large class of oxides with the perovskite structure, it is imperative to understand the fundamental aspects of its thin-film expitaxy and, in particular, any anomalous behavior it may exhibit. X-ray diffraction measurements have discovered a large negative Poisson's ratio for SrTiO3 thin films grown on Si(001). Polarization dependent extended x-ray absorption fine-structure measurements demonstrate that this elastic anomaly is driven by the interfacial polarization of the SrTiO3 layers. First-principles density-functional calculations support these conclusions.
Citation
Nature Materials

Keywords

perovskite structure, Poisson's ratio, polarization, SrTiO3 thin films

Citation

Aguirre-Tostado, F. , Herrera-Gomez, A. , Woicik, J. , Droopad, R. , Yu, Z. , Schlom, D. , Karapetrova, E. , Pianetta, P. and Hellberg, C. (2021), Large Negative Poisson's Ratio for SrTiO3 Thin Films Grown on Si(001, Nature Materials (Accessed June 20, 2024)

Issues

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Created October 12, 2021