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Physics

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Displaying 201 - 225 of 2498

Advancing Measurement Science for Microelectronics: CHIPS R&D Metrology Program

February 13, 2024
Author(s)
Marla L. Dowell, Hannah Brown, Gretchen Greene, Paul D. Hale, Brian Hoskins, Sarah Hughes, Bob R. Keller, R Joseph Kline, June W. Lau, Jeff Shainline
The CHIPS and Science Act of 2022 called for NIST to "carry out a microelectronics research program to enable advances and breakthroughs....that will accelerate the underlying R&D for metrology of next-generation microelectronics and ensure the

Emission Ghost Imaging: reconstruction with data augmentation

February 1, 2024
Author(s)
Kevin J. Coakley, Heather H. Chen-Mayer, Bruce D. Ravel, Daniel Josell, Nikolai Klimov, Sarah Robinson, Daniel S. Hussey
Ghost Imaging enables 2D reconstruction of an object even though particles transmitted or emitted by the object of interest are detected with a single pixel detector without spatial resolution. This is possible because the incident beam is spatially

Intra-grain local luminescence properties of CdSe0.1Te0.9 Thin Films

December 25, 2023
Author(s)
Ganga Neupane, Behrang Hamadani, David Albin, Joel Duenow, Matthew Reese, Susanna Thon
We report on the local photoluminescence properties of grains and grain boundaries of CdSe0.1Te0.9 thin film deposited by the colossal grain growth method using a wide-field hyperspectral imaging technique. We observed significant variations in the

Visualizing the merger of tunably coupled graphene quantum dots

December 6, 2023
Author(s)
Daniel Walkup, Fereshte Ghahari, Steven R. Blankenship, Kenji Watanabe, Takashi Taniguchi, Nikolai Zhitenev, Joseph A. Stroscio
Coupled quantum dots have been realized in a wide variety of physical systems and have attracted interest for many different applications. Here, we examine novel graphene quantum dots in backgated devices on hBN, and visualize their merger using scanning

Bipartite time-energy uncertainty relation for quantum metrology with noise

December 5, 2023
Author(s)
Philippe Faist, Mischa Woods, Victor Albert, Joseph Renes, Jens Eisert, John Preskill
Noise in quantum metrology reduces the sensitivity to which one can determine an unknown parameter in the evolution of a quantum state, such as time. Here, we consider a system prepared in a pure state that evolves according to a given Hamiltonian. We
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