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Metrology

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Displaying 1601 - 1625 of 2718

Demonstrating the metrological compatibility of uranium isotope amount ratio measurement results performed by GSMS, TIMS and MC-ICPMS techniques

January 5, 2010
Author(s)
Olivio Pereira de Oliveira, Willy De Bolle, Stefan Richter, Adolfo Alonso, Emmanuel Ponzevera, Christophe Qu?tel, Jorge Eduardo de Souza Sarkis, Roger Wellum, Ruediger Kessel
The metrological compatibility of n(234U)/n(238U), n(235U)/n(238U) and n(236U)/n(238U) isotope amount ratio measurement results performed by gas source mass spectrometry (GSMS), thermal ionisation mass spectrometry (TIMS) and multi-collector inductively

Nanoscale Measurements With the TSOM Optical Method

January 4, 2010
Author(s)
Ravikiran Attota
A novel through-focus scanning optical microscope (TSOM - pronounced as 'tee-som') technique that produces nanometer dimensional measurement sensitivity using a conventional optical microscope by analyzing images obtained at different focus positions will

Performance Evaluation and Metrics for Perception in Intelligent Manufacturing

December 31, 2009
Author(s)
Roger D. Eastman, Tsai H. Hong, Jane Shi, Tobias Hanning, Bala Muralikrishnan, S. S. Young, Tommy Chang
Real-time three-dimensional vision has been rapidly advancing over the past twenty years, leading to a number of successful laboratory demonstrations, including real-time visual servoing, autonomous vehicle navigation , and real-time people and vehicle

Optical high-power nonlinearity comparison between the National Institute of Standards and Technology and the National Metrology Institute of Japan at 1480 nm

December 23, 2009
Author(s)
Igor Vayshenker, Shao Yang, Kuniaki Amemiya, Seiji Mukai, T. Zama
We compare the results of measurements of the nonlinearity of high-power optical fiber powermeters (OFPMs) by two national metrology institutes (NMIs): the National Institute of Standards and Technology (NIST-USA) and the National Metrology Institute of

Marketplace Assessment - Metric Labeling on Packages in Retail Stores

December 14, 2009
Author(s)
Elizabeth J. Benham
Use of metric labeling on United States consumer products has a long history. Currently, the Fair Packaging and Labeling Act (FPLA) requires dual unit labeling, while products regulated by states under the Uniform Packaging and Labeling Regulation (UPLR)

Traceability for Ballistics Signature Measurements in Forensic Science

December 1, 2009
Author(s)
Jun-Feng Song, Theodore V. Vorburger, Susan M. Ballou, Li Ma, Thomas Brian Renegar, Xiaoyu Alan Zheng, Martin Ols
The National Institute of Standards and Technology (NIST) in collaboration with the Bureau of Alcohol, Tobacco, Firearms, and Explosives (ATF) has developed the Standard Reference Material (SRM) 2460 Bullets and 2461 Casings. NIST has also developed a 2D

Optimizing Acoustic Measurements of the Boltzmann Constant

November 22, 2009
Author(s)
Michael R. Moldover
We review the progress in acoustic metrology of gases that has occurred since the 1988 measurement of the universal gas constant R using a spherical acoustic resonator. The advances in understanding resonators and in calculating the thermophysical

Optical TSOM method for 3D interconnect metrology

November 18, 2009
Author(s)
Ravikiran Attota
There is a great need for high accurate, truly-3D metrology solutions that can be used for analysis of high aspect ratio features such as through-silicon-vias (TSVs). In this presentation we propose evaluating the viability of the newly developed through

Interoperability and the DMIS experience

October 30, 2009
Author(s)
John A. Horst
Because they enable true interoperability, information exchange standards can help manufacturers reduce cost and improve product quality, but only if the standards are developed and implemented correctly. We will answer questions manufacturers and

NIST High Resolution X-Ray Diffraction Standard Reference Material: SRM 2000

October 30, 2009
Author(s)
Donald A. Windover, David L. Gil, Albert Henins, James P. Cline
NIST recently released a standard reference material (SRM) for the calibration of high resolution X-ray diffraction (HRXRD) instruments. HRXRD is extensively used in the characterization of lattice distortion in thin single, epitaxial crystal layers on

Report on the Key Comparison CCPR K2.a-2003

October 30, 2009
Author(s)
Yoshihiro Ohno, Steven W. Brown, Thomas C. Larason
Under the framework of Mutual Recognition Arrangement (MRA) for national measurements standards and for calibration and measurement certificates issued by National Metrology Institutes (NMIs) signed in 1999, an international comparison of spectral

Mathematical Metrology for Evaluating a 6DOF Visual Servoing System

October 8, 2009
Author(s)
Tommy Chang, Tsai H. Hong, Milli Shah, Roger D. Eastman
In this paper we develop the best homogeneous matrix trans- formation to fit two streams of dynamic six-degree-of-freedom (6DOF) data for evaluating perception systems using ground truth. In particular, we compare object position and orien- tation results
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