U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Metrology

Search Publications

Search Title, Abstract, Conference, Citation, Keyword or Author
  • Published Date
Displaying 1551 - 1575 of 2718

Modeling and metrology of metallic nanowires with application to microwave interconnects

May 23, 2010
Author(s)
Kichul Kim, Thomas M. Wallis, Paul Rice, Chin J. Chiang, Atif A. Imtiaz, Pavel Kabos, Jintao Zhang
Abstract: Broadband characterization of individual metallic nanowires for microwave interconnect applications is discussed. Circuit and method of moments (MoM) modeling are benchmarked using a set of coplanar waveguide (CPW) test devices with microwire Au

Simultaneous XAFS Measurements of Multiple Samples

May 17, 2010
Author(s)
Bruce D. Ravel, C. Scorzato, D. P. Siddons, S. D. Kelly, S. R. Bare
A four-channel ionization chamber has been designed, constructed and tested. This ionization chamber allows X-ray absorption spectra to be collected in transmission from up to four samples simultaneously. This results in spectra that are free of systematic

Uncertainty Budgeting for Range Calibration

May 10, 2010
Author(s)
Ruediger Kessel, Raghu N. Kacker, Klaus-Dieter Sommer
The Guide to the Expression of Uncertainty (GUM) in Measurement established a general procedure to evaluate measurement uncertainty. The Guide covers only the evaluation of a single result or a set of results. Modern measurement instruments and procedures

Solutions for Determining Equibiaxial Substrate Strain for Dynamic Cell Culture

May 2, 2010
Author(s)
Martin Y. Chiang, Tianle Cheng, Lisa Pakstis, Joy P. Dunkers
Empirical and analytical solutions are derived in this study to determine the equibiaxial strain on a flexible substrate upon which the cells can be cultured. The empirical formula is based on the mechanistic constraint and a regression analysis of results

NEXT GENERATION GUARDED HAMON TRANSFER STANDARDS FOR HIGH RESISTANCE

May 1, 2010
Author(s)
Dean G. Jarrett, Andrew J. Dupree
Guarded Hamon transfer standards have been used at NIST for decades for scaling to high resistance levels. A recent project has been undertaken to apply improved designs in guarded Hamon transfer standards to the 1 MΩ to 100 MΩ ranges with the larger goal

Code-division SQUID multiplexing

April 23, 2010
Author(s)
Michael D. Niemack, Kent D. Irwin, Joern Beyer, Hsiao-Mei Cho, William B. Doriese, Gene C. Hilton, Carl D. Reintsema, Daniel R. Schmidt, Joel N. Ullom, Leila R. Vale
Multiplexed superconducting quantum interference device (SQUID) readout systems are a critical technology for measuring large arrays of superconducting transition-edge sensor (TES) detectors. Current successful SQUID multiplexing architectures are

NIST Calibration Services for Hydrometers.

April 19, 2010
Author(s)
John D. Wright, Vern E. Bean
The National Institute of Standards and Technology (NIST) provides calibration services for hydrometers used to measure liquid density. Hydrometers with scales for density, specific gravity, proof spirit for alcohol solutions, API degrees for petroleum

Applications of Cross-Correlation Functions

April 14, 2010
Author(s)
Theodore V. Vorburger, Jun-Feng Song, Wei Chu, Li Ma, Xiaoyu A. Zheng, Thomas B. Renegar, Son H. Bui
We describe several examples where we use cross-correlation functions to quantify the similarity of 2D surface profiles or of 3D surface topography images. The applications have included 1) the manufacture of Standard Reference Material (SRM) bullets and

Direct Evidence of Nanoparticle Release from Epoxy Nanocomposites Exposed to UV Radiation

April 14, 2010
Author(s)
Tinh Nguyen, Bastien T. Pellegrin, Coralie Bernard, Xiaohong Gu, Justin M. Gorham, Paul E. Stutzman, Alexander J. Shapiro, Walter E. Byrd, Joannie W. Chin
This study assessed the fate of SiO2 nanoparticles (nanoSiO2) in epoxy/nanoSiO2 composites exposed to ultraviolet (UV) radiation. The matrix was a stoichiometric mixture of adiglycidyl ether of bisphenol A epoxy and an aliphatic tri-amine. Films of

Performance of Critical Flow Venturis under Transient Conditions

April 13, 2010
Author(s)
John D. Wright
Critical flow venturis (CFVs) can be used to measure flow under transient pressure and flow conditions with uncertainties of 0.13 % or less (95 % confidence level). Blow-down tests transferred 630 g of nitrogen during a 100 s interval from an unregulated

A Second-Generation NIST Gravimetric Hygrometer

April 1, 2010
Author(s)
Christopher W. Meyer, Joseph T. Hodges, Gregory E. Scace, James R. Whetstone, R W. Hyland
A second-generation primary hygrometer has been completed at the National Institute of Standards and Technology (NIST). A gravimetric hygrometer measures humidity by separating the water from the carrier gas using desiccants and afterwards independently

Adhesion research at the National Institute of Standards and Technology (NIST)

April 1, 2010
Author(s)
Christopher M. Stafford, Adam J. Nolte, Gale A. Holmes, Sheng Lin-Gibson, John A. Howarter
NIST s involvement in adhesion research has been wide ranging and is ultimately in response to interactions between individual project leaders and our industrial partners. In this way, NIST s participation in the Adhesion Society has been instrumental in

High-Frequency Dielectric Measurements: A Tutorial

April 1, 2010
Author(s)
James R. Baker-Jarvis, Michael D. Janezic, Donald C. DeGroot
KNOWLEDGE of the response of materials to electromagnetic (EM) fields in the frequency range of radio frequency (RF) through terahertz (THz) is critical to numerous research projects and electronic product development activities. Electromagnetic waves in

Influence of Ti and Ta doping on the irreversible strain limit of ternary Nb 3 Sn superconducting wires made by the restacked-rod process

April 1, 2010
Author(s)
Najib Cheggour, Loren F. Goodrich, Theodore C. Stauffer, Jolene D. Splett, Xifeng Lu, A. K. Ghosh, G. Ambrosio
Nb 3Sn superconducting wires made with restacked-rod process (RRP®) were found to have a dramatically improved resilience to axial tensile strain when alloyed with Ti as compared to Ta. Whereas Ta-alloyed Nb 3Sn in RRP wires showed permanent damage to its

The Limits and Extensibility of Optical Patterned Defect Inspection

April 1, 2010
Author(s)
Richard M. Silver, Bryan M. Barnes, Martin Y. Sohn, Richard Quintanilha, Hui Zhou, Chris Deeb, Mark Johnson, Milton Goodwin, Dilip Patel
New techniques recently developed at the National Institute of Standards and Technology using bright field optical tools are applied to signal-based defect analysis of features with dimensions well below the measurement wavelength. A key to this approach

Certification of Drugs of Abuse in a Human Serum Standard Reference Material: SRM 1959

March 24, 2010
Author(s)
Susan S. Tai, Jocelyn L. Prendergast, Lorna T. Sniegoski, Michael J. Welch, Karen W. Phinney, Nien F. Zhang
A new Standard Reference Material (SRM) for drugs of abuse in human serum (SRM 1959) has been developed. SRM 1959 is a frozen human serum material fortified with seven drugs of abuse, benzoylecgonine (BZE), methadone (METH), methamphetamine (MAMP)
Was this page helpful?