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Metrology

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Displaying 951 - 975 of 2729

DEVELOPMENT OF A MINIATURE, MULTICHANNEL, EXTENDED-RANGE FABRY-PEROT FIBER-OPTIC LASER INTERFEROMETER SYSTEM FOR LOW FREQUENCY SI-TRACEABLE DISPLACEMENT MEASUREMENT

October 12, 2014
Author(s)
Bartosz K. Nowakowski, Douglas T. Smith, Stuart T. Smith
Laser interferometry has become a staple of SI-traceable displacement measurement techniques. With decreasing cost per channel, miniaturization, and a multitude of commercially available off-the-shelf systems, these systems create ever more attractive

Photonic-assisted Endoscopic Analysis of W-band Waveguide

October 12, 2014
Author(s)
Jeffrey A. Jargon, DongJoon Lee, JaeYong Kwon, YoungPyo Hong
We demonstrate an endoscopic probing system to measure field distribution through a W-band waveguide. The electric fields propagating inside a WR-10 waveguide are measured utilizing W-band harmonics of a femtosecond laser with a minute photonic probe.

Solid State Lighting Annex 2013 Interlaboratory Comparison Final Report

October 9, 2014
Author(s)
Yoshihiro Ohno
The Interlaboratory Comparison, IC2013, for measurement of solid state lighting (SSL) products was conducted by International Energy Agency (IEA) 4E SSL Annex between October 2012 and August 2013. 55 laboratories from 18 countries participated in this

Evaluating CT for Metrology: The Influence of Material Thickness on Measurements

October 7, 2014
Author(s)
Joseph Schlecht, Eric Ferley, Shaun COUGHLIN , Steven D. Phillips, Vincent Lee, Craig M. Shakarji
X-ray imaging provides a non-destructive means to measure internal features of a workpiece, and CT offers unique capabilities for internal measurements in 3-D. However, due to the computational nature of CT and its indirect measurement process, assessing

Comb-calibrated laser ranging for three-dimensional surface profiling with micrometer-level precision at a distance

October 6, 2014
Author(s)
Esther Baumann, Fabrizio R. Giorgetta, Jean-Daniel Deschenes, William C. Swann, Ian R. Coddington, Nathan R. Newbury
Non-contact surface mapping at a distance is interesting in diverse applications including industrial metrology, manufacturing, forensics, and artifact documentation and preservation. Frequency modulated continuous wave (FMCW) laser detection and ranging

Estimation of uncertainty in application profiles

October 3, 2014
Author(s)
David W. Flater
Performance is an important facet of software quality, and application profiling tools are the instruments used to measure software performance at the function and application levels. The most powerful measurement method available in application profiling

Amplifier and Transistor Noise-Parameter Measurements

October 1, 2014
Author(s)
James P. Randa
Methods for measuring the noise parameters of amplifiers and on-wafer transistors are reviewed. After some preliminary background information and conventions, noise parameters are defined and the most common measurement strategies are presented, both for

An improved L1 based algorithm for standardized planar datum establishment

October 1, 2014
Author(s)
Craig M. Shakarji, Vijay Srinivasan
This paper has two major goals. First, we present an algorithm for establishing planar datums suitable for a default in tolerancing standards. The algorithm is based on a constrained minimization search based on the L_1 (L1) norm after forming a convex

NIST Framework and Roadmap for Smart Grid Interoperability Standards, Release 3.0

October 1, 2014
Author(s)
Chris Greer, David A. Wollman, Dean Prochaska, Paul A. Boynton, Jeffrey A. Mazer, Cuong Nguyen, Gerald FitzPatrick, Thomas L. Nelson, Galen H. Koepke, Allen R. Hefner Jr., Victoria Yan Pillitteri, Tanya L. Brewer, Nada T. Golmie, David H. Su, Allan C. Eustis, David Holmberg, Steven T. Bushby
Section 1305 of the Energy Independence and Security Act (EISA) of 2007 (Pub. L. 110-140) directs NIST ‘‘to coordinate the development of a framework that includes protocols and model standards for information management to achieve interoperability of

Roadmap for Building Commissioning Research Workshop Summary Report

September 30, 2014
Author(s)
Natascha S. Milesi-Ferretti, David Shipley, Walter Zalis, Steven T. Bushby
This report summarizes the results of the Building Commissioning Research and Measurement Science Needs Webinar Workshop held on April 29, 2014, sponsored by the National Institute of Standards and Technology. This effort supports ongoing research into

Degrees of Equivalence for Chemical Measurement Capabilities: Primary pH

September 10, 2014
Author(s)
David L. Duewer, Kenneth W. Pratt, Chainarong Cherdchu, Nongluck Tangpaisarnkul2 Nongluck Tangpaisarnkul2, Akiharu Hioki, Masaki Ohata, Petra Spitzer, Michal M?ri?ssy, Leo? Vysko?il
The Key Comparison (KC) studies of the Consultative Committee for Amount of Substance – Metrology in Chemistry (CCQM) help ensure the reliability of chemical and biochemical measurements relevant to international trade and environmental , health , and

Software for Dielectric characterization by microwave cavity perturbation corrected for non-uniform fields*

September 1, 2014
Author(s)
Nathan D. Orloff, Jan Obrzut, Christian J. Long, Thomas F. Lam, Pavel Kabos, David R. Novotny, James C. Booth, James A. Liddle
This software package was developed to analyze microwave cavity perturbation data in order to determine material dielectric properties. Example software is provided to assist with data acquisition and organization. Specifically, it is de-signed to be used

July is National Ice Cream Month

August 27, 2014
Author(s)
Elizabeth J. Benham
A short article about ice cream and frozen novelties to appear in the Office of Weights and Measures newsletter, "Weights and Measures Connection." This document sites sections of the NIST Handbook 130, "Uniform Laws and Regulations in the Areas of Legal
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