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Metrology

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Displaying 2751 - 2757 of 2757

A Constant Momentum Transfer Average Study of PLEED Data from W(100)

January 1, 1982

Author(s)

G Wang, Robert Celotta, Daniel T. Pierce

Electron Spin Polarization Measurements in Atomic and Surface Physics

January 1, 1982

Author(s)

Robert Celotta, Daniel T. Pierce

Absorbed Current Electron Spin Polarization Detector

October 1, 1981

Author(s)

Daniel T. Pierce, S Girvin, john unguris, Robert Celotta

The principle of spin analysis by means of measurement of the spin dependent absorption of a polarized electron beam is presented. The spin dependent signal is enhanced relative to the spin averaged signal at an energy near which the secondary yield is

An Electron Spin Polarization Detector: Spin Dependent Absorption of a Polarized Electron Beam

April 1, 1981

Author(s)

Robert Celotta, Daniel T. Pierce, H Siegmann, john unguris

The exchange interaction and the spin-orbit interaction are observed to cause a spin dependence of the absorption of a polarized electron beam in the amorphous ferromagnet Ni 40Fe 40B 20 and a W(100) single crystal respectively. The enhancement of the spin

Electron Transport Optics for the Cylindrical Mott Detector

January 1, 1981

Author(s)

Michael H. Kelley

Electron-Excited Energy Dispersive X-ray Spectrometry in the Variable Pressure Scanning Electron Microscope (EDS/VPSEM): Its Not Microanalysis Anymore!

Author(s)

Dale E. Newbury, Nicholas W. Ritchie

X-ray spectra measured in the variable-pressure scanning electron microscope (VPSEM, chamber pressure 1 to 2500 Pa) suffer significantly degraded spatial resolution compared to high-vacuum SEM (operating pressure 0.1 mass fraction), minor (0.01≤ C ≤ 0.1)

Metrology and process control: dealing with measurement uncertainty

Author(s)

James E. Potzick

Metrology is often used in designing and controlling manufacturing processes. A product sample is processed, some relevant property is measured, and the process adjusted to bring the next processed sample closer to its specification. This feedback loop can

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