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Materials

Ceramics

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Displaying 826 - 850 of 1323

Fundamental Parameters Line Profile Fitting in Laboratory Diffractometers

February 1, 2004
Author(s)
R W. Cheary, A A. Coelho, James Cline
The fundamental parameters approach to line profile fitting uses physically based models to generate the line profile shapes. Fundamental parameters profile fitting (FPPF) has been used to synthesize and fit data from both parallel beam and divergent beam

Soft X-Ray Absorption Spectroscopic Study of a LiNi 0.5 Mn 0.5 O 2 Cathode During Charge

February 1, 2004
Author(s)
W S. Yoon, Mahalingam Balasubramanian, Xiao-Qing Yang, Ziwen Fu, Daniel A. Fischer, James McBreen
Soft X-ray (200 eV to 1000 eV) absorption spectroscopy (XAS) at the O K-edge and the metal L II, III-edges, in both the fluorescence yield (FY) and the partial electron yield (PEY) mode, has been used to probe the electronic structure of electrochemically

Strength of Silicon Containing Nanoscale Flaws

February 1, 2004
Author(s)
Antonia Pajares, Michael Chumakov, Brian R. Lawn
A study was made of the strength of highly polished silicon surfaces after nanoindentation with a Berkovich diamond. Strengths of the indented surfaces were measured as a function of flaw size, quantified by indenter penetration. Analogous data from etched

Bayesian Analysis of Ceria Nanoparticles From Line Profile Data

January 12, 2004
Author(s)
N G. Armstrong, A Dowd, James Cline, W Kalceff
A Bayesian/Maximum entropy (MaxEnt) method is applied to quantify the broadening of X-ray line profiles in terms of the nanocrystallite size effects in ceria. The analysis is in general agreement with transmission electron microscopy results, while

Combined NMR and XAS Study on Local Environments and Electronic Structures of the Electrochemically Li-Ion Deintercalated Li1-xCo1/3Ni1/3Mn1/302 Electrode System

January 1, 2004
Author(s)
W S. Yoon, C P. Grey, Mahalingam Balasubramanian, Xiao-Qing Yang, Daniel A. Fischer, James McBreen
Combined 6Li MAS NMR, in-situ metal K-edge (hard) XAS, and O K-edge (soft) XAS have been carried out during the first charging process for the layered Li1-xCo1/3Ni1/3Mn1/3O2 cathode material. The 6Li MAS NMR results showed the prescence of Li in the Ni2+

Flux Loss Measurements of Ag- Sheathed Bi-2223 Tapes

January 1, 2004
Author(s)
Mi-Hye Jang, Winnie K. Wong-Ng, Robert D. Shull, Lawrence P. Cook, DeaSik Suh
Alternating current (AC) losses of two Bi-2223 ([Bi, Pb] : Sr : Ca : Cu :O = 2:2:2:3) tapes [one untwisted (Tape I, twist-pitch of mm) and the other with a twist-pitch of 8mm (Tape II)] were measured and compared. These samples, produced by the powder-in

In-Vitro Contact Wear of Dental Composites

January 1, 2004
Author(s)
V S. Nagarajan, S Jahanmir, V P. Thompson
Three commercial dental composites with filler loading of 75-76 wt% were evaluated. The wear results were compared with those reported in an earlier study on a highly filled composite containing predominately alumino-silicate glass fillers and alumina at a

Fracture of Ceramic/Ceramic/Polymer Trilayers for Biomechanical Applications

December 1, 2003
Author(s)
Y N. Deng, P Miranda, Antonia Pajares, Brian R. Lawn
Fracture damage in trilayers consisting of outer and inner brittle layers bonded to a compliant (polycarbonate) substrate and subjected to concentrated surface loading is analyzed. The principal mode of fracture is radial cracking at the undersurface of

Nitrogen-Activated Bowing of Dilute In y Ga 1-y As 1- x N x Based on Photoreflectance Studies

December 1, 2003
Author(s)
M M. Fahmi, A Kahn, J A. Griffin, G L. Harris, Larry Robins, Anthony G. Birdwell, Youn S. Kang, D J. Smith, T Steiner, S N. Mohammad
The dependence of the fundamental band gap and higher-lying critical-point energies of dilute-nitrogen Ga 1-yIn yAs 1-xN x epilayers on nitrogen mole fraction (x), for x less than or equal to} 0.0125, and temperature, from 20 K to 295 K, was investigated

MatML: A Data Interchange Markup Language

November 1, 2003
Author(s)
J G. Kaufman, E F. Begley
This paper updates and expands upon previously published information on MatML, a new extensible markup language designed specifically for the exchange of materials information. In particular, it will describe the strengths of MatML from the perspective of
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