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Electronics

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Displaying 526 - 550 of 1388

Deployment of a Compact, Transportable, Fully Automated Josephson Voltage Standard

April 1, 1999

Author(s)

Stuward L. Kupferman, Clark A. Hamilton

A compact, transportable, Josephson voltage standard, first reported at CPEM96, has now been field tested and has had ten months of use as a primary standard by National Aeronautics and Space Administration (NASA) laboratories. We discuss here its

Programmable 1 V DC Voltage Standard

April 1, 1999

Author(s)

Charles J. Burroughs, Samuel Benz, Clark A. Hamilton, Todd E. Harvey

We have developed a Josephson voltage standard that produces intrinsically stable voltages that are programmable of 32 768 SNS (superconductor-normal-superconductor) Josephson junctions. The output can source or sink up to 2 mA and thus has high noise

Improved VO 2 Microbolometers for Infrared Imaging: Operation on the Semiconducting-Metallic Phase Transition with Negative Electrothermal Feedback

January 1, 1999

Author(s)

Carl D. Reintsema, Erich N. Grossman, Jonathan A. Koch

We have investigated the performance of VO 2 microbolometers biased on the semiconducting-metal phase transition with negative electrothermal feedback. We deposited crystalline thin films of phase-pure VO 2, patterned these films into useful test

Active Cavity Absolute Radiometer Based on High-Tc Superconductors

December 31, 1998

Author(s)

Joseph P. Rice, Steven R. Lorentz, Raju V. Datla, Leila R. Vale, David A. Rudman, M. L. Sing, D. Robbes

Chaos

December 31, 1998

Author(s)

Richard L. Kautz

Lithographic Dipole Antenna Properties at 10 fm Wavelength: Comparison of Method-of-Moments Predicitions with Experiment

December 31, 1998

Author(s)

Erich N. Grossman, Jonathan A. Koch, Carl D. Reintsema, A. Green

Dipole antennas designed for operation at 10 5m wavelength have been fabricated by optical lithography and their properties measured by detection of CO 2 laser rediation in integrated thin-film bolometers. We find a remarkably strong increase in cross

Multilayer Processing of High-T c Films and Stacked Bicrystal Josephson Junctions

December 31, 1998

Author(s)

H. Q. Li, Ronald H. Ono, David A. Rudman, Leila R. Vale, Sy-Hwang Liou

The Fourth Interlaboratory Comparison of 10 V Josephson Voltage Standards in North America

December 31, 1998

Author(s)

Chih-Ming Wang, Clark A. Hamilton

Doping Effects and Reversibility Studies on Gas-Exposed alpha-Sexithiophene Thin Films

December 25, 1998

Author(s)

C Kendrick, Stephen Semancik

Research on the electronic applications of organic semiconductors is growing rapidly, and both polymeric and small molcule organics are being used in the fabrication of LEDs, transistors, and biological/chemical sensors. As a part of the chemical

Specific NIST Projects in Support of the NIJ Concealed Weapon Detection and Imaging Program

November 1, 1998

Author(s)

Nicholas G. Paulter Jr.

The Electricity Division of the National Institute of Standards and Technology is developing revised performance standards for hand-held (HH) and walk-through (WT) metal weapon detectors, test procedures and systems for these detectors, and a detection

Microwave Power Handling in Engineered Yba 2 Cu 3 O^d6-d Grain Boundaries

October 12, 1998

Author(s)

Y. M. Habib, D. E. Oates, G. Dresselhaus, M. Dresselhaus, Leila R. Vale, Ronald H. Ono

Microwave-frequency (rf) power-dependence measurements performed on thin-film Yba 2Cu 3O^d7-δ grain boundaries engineered on sapphire bicrystal substrates with misorientation angles of θ=20, 50, 100, and 240 are presented. The data are compared to

A Bibliography of Publications of the NIST Electromagnetic Technology Division

September 1, 1998

Author(s)

A. G. Bradford

This bibliography lists the publications of the staff of the Electromagnetic Technology Division of NIST during the period from January 1970 through July 1999. The bibliography is divided into two general sections: (a) Cryoelectronic Metrology and (b)

Application of Microcalorimeter EDS X-Ray Detectors to Particle Analysis

September 1, 1998

Author(s)

Alain C. Diebold, David A. Wollman, Kent D. Irwin, John M. Martinis, B. H. Liu

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