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Electronics

Optoelectronics

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Displaying 251 - 275 of 389

Reflective optical chopper used in NIST high-power laser measurements

November 1, 2008
Author(s)
Xiaoyu X. Li, Thomas Scott, Christopher L. Cromer, Joshua A. Hadler
For the past ten years, NIST has used high-reflectivity, optical choppers as beamsplitters and attenuators when calibrating the absolute responsivity and response linearity of detectors used with high-power CW lasers. The chopper-based technique has

Robustness of display hemispherical reflectance measurement apparatus

October 1, 2008
Author(s)
John Penczek, Edward F. Kelley, Seugkwan Kim
Reflection measurements are critical to the evaluation of display performance under ambient illumination conditions. Various hemispherical reflection methods are evaluated for their suitability and robustness across display technologies. The standard

Ultra-low-noise all-fiber photon pair source

August 21, 2008
Author(s)
Shellee D. Dyer, Martin J. Stevens, Burm Baek, Sae Woo Nam
We demonstrate an all-fiber photon pair source with the highest coincidence-to-accidental ratio (CAR) reported to date in the fiber optic telecom C-band.

Synchronization monitoring of I/Q data and pulse carving misalignment for a serial-type 80-Gb/s RZ-DQPSK transmitter through optical/RF clock tone measurement

August 4, 2008
Author(s)
Jeffrey A. Jargon, Xiaoxia Wu, Louis Christen, Scott Nuccio, Omer F. Yilmaz, Loukas Paraschis, Yannick K. Lize, Alan Willner
We experimentally demonstrate a monitoring technique for determining misalignment between the in-phase/ quadrature (I/Q) data streams and between the data and pulse carving in an 80 Gb/s serial-type return-to-zero differential quadrature phase-shift-keying

Diffusion Confusion

February 1, 2008
Author(s)
Edward F. Kelley
We discuss the true definitions of specular and diffuse reflection. Many people think that diffuse reflection is Lambertian reflection. Such is not the case. Lambertian is a special type of diffuse reflection, and the often-used equations for Lambertian

Photoconductive lifetimes of carbon nanotubes films

November 29, 2007
Author(s)
Katie Hurst, Richard K. Ahrenkiel, Steve W. Johnston, Anne Dillon, Lara Roberson, John H. Lehman
The photoconductive recombination lifetimes of carbon nanotube (CNT) thin films as a function of wavelength are measured by resonant-coupled photoconductive decay (RCPCD) method (1). The carrier recombination lifetime is a fundamental property of carbon
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