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Electronics

Optoelectronics

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Displaying 226 - 250 of 389

Lateral variations in self-assembled InGaAs quantum dot distributions

June 26, 2009
Author(s)
Alexana Roshko, Todd E. Harvey, Brittany L. Hyland, Lehman Y. Susan, Keith D. Cobry
The lateral uniformity of self-assembled InGaAs quantum dots grown by molecular beam epitaxy(MBE) was assessed as a function of growth conditions. Variations in the dot density and height were determined from atomic force micrographs. Growth rate had a

Projector flux from color primaries

May 2, 2009
Author(s)
Edward F. Kelley
A standard methodology exists for estimating the flux from front projection displays by sampling the projected illuminance of a white source signal. With the advent and use of white projection primaries, a dramatic increase in flux can be achieved over the

Character contrast under uniform ambient conditions

May 1, 2009
Author(s)
Edward F. Kelley, John Penczek, Paul A. Boynton
The measurement of small-area black regions on a white screen (such as a character stroke) can be subject to large errors because of veiling glare in the detector. Using replica masks can enable more accurate measurements of small-area-black and character

Electron Microscope Study of Strain in InGaN Quantum Wells in GaN Nanowires

April 1, 2009
Author(s)
Roy H. Geiss, David T. Read
GaN nanowires with InGaN quantum wells (QW) were grown on heated Si(111) substrates by molecular beam epitaxy (MBE) using elemental Ga and In and a radio-frequency-plasma N2 source. The growth procedures and the morphology of these nanowires have been

EEEL Technical Accomplishments

March 30, 2009
Author(s)
Erik M. Secula
This document describes the technical work of the Electronics and Electrical Engineering Laboratory. In this report, you will find that EEEL researchers are developing the world's most advanced sensors, providing advanced gamma ray imagers for astronomical

Calculation of pulse parameters and propagation of uncertainty

March 1, 2009
Author(s)
Paul D. Hale, Chih-Ming Wang
The fundamental starting point for the analysis of all two-state waveforms is the determination of the low- and highstate levels. This is a two-step process. First, the data are grouped into points belonging to each state, and second, the value of each

Measuring optical waveforms with fiber frequency combs

January 5, 2009
Author(s)
Ian R. Coddington, William C. Swann, Nathan R. Newbury
A stabilized frequency comb provides a broadband array of highly resolved comb lines. Using a multiheterodyne technique, we measure the amplitude and phase of every comb line, allowing for massively parallel, high-resolution optical sampling.

Character contrast

January 1, 2009
Author(s)
Edward F. Kelley
Measurement of a small black area on a white electronic display screen is often accompanied by serious contamination from veiling glare in the detector. The black measurement can be thousands of percent in error. Character-stroke-contrast or small-area
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