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Robustness of display reflectance measurements: Comparison between BRDF and hemispherical diffuse reflectance

Published

Author(s)

Seungkwan Kim, Edward F. Kelley, John Penczek

Abstract

We measured in-plane bidirectional-reflectance-distribution-function (BRDF) profiles for specular, haze and Lambertian samples using a converging light beam and a photopic photodiode. The results were validated by comparing the hemispherical reflectance values calculated from BRDF data with direct measurements by the use of integrating spheres, whereby an agreement to within 2 % was achieved.
Proceedings Title
Digest of Technical Papers of the Society for Information Display International Symposium
Conference Dates
June 1-5, 2009
Conference Location
San Antonio, TX, US
Conference Title
SID International Symposium

Keywords

BRDF, hemispherical diffuse reflectance, display characterization

Citation

Kim, S. , Kelley, E. and Penczek, J. (2009), Robustness of display reflectance measurements: Comparison between BRDF and hemispherical diffuse reflectance, Digest of Technical Papers of the Society for Information Display International Symposium, San Antonio, TX, US, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=902277 (Accessed June 21, 2024)

Issues

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Created May 31, 2009, Updated October 12, 2021