Kim, S.
, Kelley, E.
and Penczek, J.
(2009),
Robustness of display reflectance measurements: Comparison between BRDF and hemispherical diffuse reflectance, Digest of Technical Papers of the Society for Information Display International Symposium, San Antonio, TX, US, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=902277
(Accessed October 25, 2025)
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Robustness of display reflectance measurements: Comparison between BRDF and hemispherical diffuse reflectance
Published
Author(s)
Seungkwan Kim, ,
Abstract
We measured in-plane bidirectional-reflectance-distribution-function (BRDF) profiles for specular, haze and Lambertian samples using a converging light beam and a photopic photodiode. The results were validated by comparing the hemispherical reflectance values calculated from BRDF data with direct measurements by the use of integrating spheres, whereby an agreement to within 2 % was achieved.Proceedings Title
Digest of Technical Papers of the Society for Information Display International Symposium
Conference Dates
June 1-5, 2009
Conference Location
San Antonio, TX, US
Conference Title
SID International Symposium
Pub Type
Conferences
Download Paper
Keywords
BRDF, hemispherical diffuse reflectance, display characterization
Citation
Issues
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Created May 31, 2009, Updated October 12, 2021