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Richard E. Cavicchi, R M. Walton, M I. Aquino-Class, J D. Allen, B. Panchapakesan
A colloidal suspension of tin oxide nanoparticles is used to prepare a highly sensitive gas sensing film on a microhotplate. Fabrication consists of spin-coating the solution over an array of micromachined hotplates and annealing. A thermolithographic
P T. Wilson, Kimberly A. Briggman, John C. Stephenson, William E. Wallace, Lee J. Richter
Broad-bandwidth vibrationally-resolved sum frequency generation spectroscopy has been used to measure the molecular orientation distribution at polystyrene/dielectric interfaces. A novel microcavity structure allows isolation of the free or buried
Among the most important, conservative geochemical tracers are the long-lived isotopes of krypton, 81Kr and 85Kr. Following a very brief review of the metrology and applications of these two radionuclides, we focus on the low-level measurement the 10.8
Recent studies suggested that 8,5'-cyclo-2'-deoxyadenosine may play a role in diseases with defective nucleotide-excision repair. This compound is one of the major lesions formed in DNA by hydroxyl radical attack on sugar moiety of 2'-deoxyadenosine. It is
The structural, spectroscopic, and thermodynamic properties of ten organic molecules in the gas phase, including three peroxides and four carboxylic acids, have been reviewed. The calculation of the thermochemical tables involved the critical evaluation of
It is now customary for the effects of elastic-electron scattering to be ignored in measurements of the thicknesses of overlayer films by X-ray photoelectron spectroscopy (XPS). It is known, however, that elastic scattering can cause the effective
The history and technical highlights leading up to and following the publication of a classic NIST publication on the theory and experiments involving optical-laser induced desorption of adsorbed NO from metal surfaces is presented.
Cedric J. Powell, Aleksander Jablonski, A Naumkin, A Kraut-Vass, Joseph M. Conny, J R. Rumble
A description is given of data resources that are available from the National Institute of Standards and Technology (NIST) for x-ray photoelectron spectroscopy (XPS) and Auger-electron spectroscopy. NIST currently has three databases available: an XPS
R. H. Christenson, S. H. Duh, F. S. Apple, G. S. Bodor, David M. Bunk, J. J. Dalluge, Mauro Panteghini, J. D. Potter, Michael J. Welch, A. H. Wu, S. E. Kahn