Williams, D.
, Chamberlin, R.
, Zhao, W.
, Cheron, J.
and Miguel, U.
(2016),
The Role of Measurement Uncertainty in Achieving First-Pass Design Success, IEEE Compound Semiconductor IC Symposium Digest, Austin, TX, US, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=921396
(Accessed May 6, 2024)
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The Role of Measurement Uncertainty in Achieving First-Pass Design Success
Published
Author(s)
, , Wei Zhao, , Urteaga Miguel
Abstract
We investigate the role of measurement uncertainty in achieving first-pass design success at microwave frequencies. We develop a model for state-of-the-art 250 nm heterojunction bipolar transistors, and demonstrate the propagation of correlated measurement uncertainties through the modelextraction and verification process. We then investigate the accuracy of the extracted model parameters and the role of measurement uncertainty in gauging the ability of the model to predict the behavior of the transistor in large-signal operating states.Proceedings Title
IEEE Compound Semiconductor IC Symposium Digest
Conference Dates
October 23-26, 2016
Conference Location
Austin, TX, US
Conference Title
Compound Semiconductor IC Symposium
Pub Type
Conferences
Download Paper
Keywords
measurement uncertainty, microwave measurement, model verification, transistor model
Citation
Created October 22, 2016, Updated April 19, 2022