@conference{876881,
  author = {Dylan Williams and Richard Chamberlin and Wei Zhao and Jerome Cheron and Urteaga Miguel},
  title = {The Role of Measurement Uncertainty in Achieving First-Pass Design Success},
  year = {2016},
  month = {2016-10-22 04:10:00},
  publisher = {IEEE Compound Semiconductor IC Symposium Digest, Austin, TX, US},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=921396},
  language = {en},
}