We review the concept of reverse noise measurements in the context of on-wafer transistor noise characterization. Several different applications of reverse noise measurements are suggested and demonstrated. Reverse measurements can be used to check measurement results, to significantly reduce the uncertainty in Γ optu , to reduce the occurence of unphysical results, and possibly to directly measure or constrain parameters in model of transistors.
Conference Dates: June 11-13, 2006
Conference Location: SAN FRANCISCO, CA
Conference Title: 2006 IEEE RADIO FREQUENCY INTEGRATED CIRCUITS SYMPOSIUM JUNE 11-13, 2006
Pub Type: Conferences
CMOS, noise, noise measurements, on-wafer measurements