@conference{758266,
  author = {James Randa and Tom McKay and Susan Sweeney and Dave Walker and Lawrence Wagner and David Greenberg and Jon Tao and G. Rezvani},
  title = {Reverse Noise Measurement and Use in Device Characterization},
  year = {2006},
  month = {2006-06-10 00:06:00},
  publisher = {2006 IEEE RADIO FREQUENCY INTEGRATED CIRCUITS SYMPOSIUM JUNE 11-13, 2006, SAN FRANCISCO, CA, USA},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32218},
  language = {en},
}