Randa, J.
, McKay, T.
, Sweeney, S.
, Walker, D.
, Wagner, L.
, Greenberg, D.
, Tao, J.
and Rezvani, G.
(2006),
Reverse Noise Measurement and Use in Device Characterization, 2006 IEEE RADIO FREQUENCY INTEGRATED CIRCUITS SYMPOSIUM JUNE 11-13, 2006, SAN FRANCISCO, CA, USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32218
(Accessed October 16, 2025)
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Reverse Noise Measurement and Use in Device Characterization
Published
Author(s)
, Tom McKay, Susan L. Sweeney, , Lawrence Wagner, David R. Greenberg, Jon Tao, G. Ali Rezvani
Abstract
We review the concept of reverse noise measurements in the context of on-wafer transistor noise characterization. Several different applications of reverse noise measurements are suggested and demonstrated. Reverse measurements can be used to check measurement results, to significantly reduce the uncertainty in Γ optu , to reduce the occurence of unphysical results, and possibly to directly measure or constrain parameters in model of transistors.Conference Dates
June 11-13, 2006
Conference Location
SAN FRANCISCO, CA, USA
Conference Title
2006 IEEE RADIO FREQUENCY INTEGRATED CIRCUITS SYMPOSIUM JUNE 11-13, 2006
Pub Type
Conferences
Download Paper
Keywords
CMOS, noise, noise measurements, on-wafer measurements
Citation
Issues
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Created June 9, 2006, Updated October 12, 2021