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Polarization of out-of-plane optical scatter from SiO2 films grown on photolithographically-generated microrough silicon, ed. by Z.H. Gu and A.A. Maradudin

Published

Author(s)

Thomas A. Germer, B W. Scheer
Citation
Scattering and Surface Roughness II SPIE
Volume
3426

Citation

Germer, T. and Scheer, B. (1998), Polarization of out-of-plane optical scatter from SiO<sub>2</sub> films grown on photolithographically-generated microrough silicon, ed. by Z.H. Gu and A.A. Maradudin, Scattering and Surface Roughness II SPIE (Accessed April 18, 2024)
Created January 1, 1998, Updated February 17, 2017