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PUBLICATIONS

Polarization of out-of-plane optical scatter from SiO2 films grown on photolithographically-generated microrough silicon, ed. by Z.H. Gu and A.A. Maradudin

Published

Author(s)

Thomas A. Germer, B W. Scheer
Citation
Scattering and Surface Roughness II SPIE
Volume
3426
Pub Type
Journals

Citation

Germer, T. and Scheer, B. (1998), Polarization of out-of-plane optical scatter from SiO<sub>2</sub> films grown on photolithographically-generated microrough silicon, ed. by Z.H. Gu and A.A. Maradudin, Scattering and Surface Roughness II SPIE (Accessed October 27, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created January 1, 1998, Updated February 17, 2017
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