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Polarization of out-of-plane optical scatter from SiO2 films grown on photolithographically-generated microrough silicon, ed. by Z.H. Gu and A.A. Maradudin
Published
Author(s)
Thomas A. Germer, B W. Scheer
Citation
Scattering and Surface Roughness II SPIE
Volume
3426
Pub Type
Journals
Citation
Germer, T.
and Scheer, B.
(1998),
Polarization of out-of-plane optical scatter from SiO<sub>2</sub> films grown on photolithographically-generated microrough silicon, ed. by Z.H. Gu and A.A. Maradudin, Scattering and Surface Roughness II SPIE
(Accessed October 16, 2025)