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Robert R. Ilic, Krishna Coimbatore Balram, Daron A. Westly, Marcelo I. Davanco, Karen E. Grutter, Qing Li, Thomas Michels, Christopher H. Ray, Liya Yu, Neal A. Bertrand, Samuel M. Stavis, Vladimir A. Aksyuk, James Alexander A. Liddle, Brian A. Bryce, Nicolae Lobontiu, Yuxiang Liu, Meredith Metzler, Gerald Lopez, David Czaplewski, Leonidas Ocola, Pavel Neuzil, Vojtech Svatos, Slava Krylov, Christopher B. Wallin, Ian J. Gilbert, Kristen A. Dill, Richard J. Kasica, Kartik A. Srinivasan, Gregory Simelgor, Juraj Topolancik
Ilic, R.
, Coimbatore Balram, K.
, Westly, D.
, Davanco, M.
, Grutter, K.
, Li, Q.
, Michels, T.
, Ray, C.
, Yu, L.
, Bertrand, N.
, Stavis, S.
, Aksyuk, V.
, Liddle, J.
, Bryce, B.
, Lobontiu, N.
, Liu, Y.
, Metzler, M.
, Lopez, G.
, Czaplewski, D.
, Ocola, L.
, Neuzil, P.
, Svatos, V.
, Krylov, S.
, Wallin, C.
, Gilbert, I.
, Dill, K.
, Kasica, R.
, Srinivasan, K.
, Simelgor, G.
and Topolancik, J.
(2016),
Nanolithography Toolbox:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.HB.160
(Accessed October 13, 2025)