Seiler, D.
(2007),
Metrology, Nanocharacterization and Instrumentation for Emerging Nanotechnology and Nanoelectronics: Electrical and Optical Characterization, Metrology, Nanocharacterization, and Instrumentation for Emerging Nanotechnology and Nanoelectronics, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32866 (Accessed May 11, 2026)
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Metrology, Nanocharacterization and Instrumentation for Emerging Nanotechnology and Nanoelectronics: Electrical and Optical Characterization
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Metrology, Nanocharacterization, and Instrumentation for Emerging Nanotechnology and Nanoelectronics
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Created December 9, 2007, Updated May 7, 2026