TY  - VIDEO
AU  - Seiler, David G.
C2  - Metrology, Nanocharacterization, and Instrumentation for Emerging Nanotechnology and Nanoelectronics
DA  - 2007-12-09 00:12:00
LA  - en
PB  - Metrology, Nanocharacterization, and Instrumentation for Emerging Nanotechnology and Nanoelectronics
PY  - 2007
TI  - Metrology, Nanocharacterization and Instrumentation for Emerging Nanotechnology and Nanoelectronics: Electrical and Optical Characterization
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32866
ER  -