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A generalized method for multiple artifacts problem in interlaboratory comparisons with linear trends

Published

Author(s)

Weiping Zhang, Nien F. Zhang

Abstract

A generalized statistical approach for interlaboratory comparisons with linear trends is proposed. This new approach can be applied to the general case when the artifacts are measured and reported multiple times in each participating laboratory. The advantages of this approach are that it is consistent with the previous approaches when only the pilot labboratory makes multiple measurements and applies to the cases that there either exists a trend or not. The uncertainties for the comparison reference value and the degree of equivalence are also provided.
Citation
Metrologia

Keywords

Comparison reference value, degrees of equivalence, generalized least square estimator, linear regression, uncertainty.

Citation

Zhang, W. and Zhang, N. (2009), A generalized method for multiple artifacts problem in interlaboratory comparisons with linear trends, Metrologia, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=890065 (Accessed February 28, 2024)
Created May 21, 2009, Updated October 12, 2021