TY  - JOUR
AU  - Weiping Zhang
AU  - Nien Zhang
C2  - Metrologia
DA  - 2009-05-22 00:05:00
LA  - en
PB  - Metrologia
PY  - 2009
TI  - A generalized method for multiple artifacts problem in interlaboratory comparisons with linear trends
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=890065
ER  -