McCrackin, F.
(1964),
A Fortran program for analysis of ellipsometer measurements and calculation of reflection coefficients from thin films:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.TN.242
(Accessed December 14, 2024)
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A Fortran program for analysis of ellipsometer measurements and calculation of reflection coefficients from thin films:
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- NBS TN 242
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NBS TN 242
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NIST Pubs
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Created January 1, 1964, Updated May 19, 2023