TY  - GEN
AU  - Frank L McCrackin
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1964-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.TN.242
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1964
TI  - A Fortran program for analysis of ellipsometer measurements and calculation of reflection coefficients from thin films:
ER  -