@misc{1156536,
  author = {Frank L McCrackin},
  title = {A Fortran program for analysis of ellipsometer measurements and calculation of reflection coefficients from thin films:},
  year = {1964},
  month = {1964-01-01 05:01:00},
  publisher = {, National Institute of Standards and Technology, Gaithersburg, MD},
  doi = {https://doi.org/10.6028/NBS.TN.242},
  language = {en},
}