Embracing Uncertainty: Modeling Uncertainty in EPMA - Part I
This is the first in a series of articles which present a new framework for computing the uncertainty in electron excited X-ray microanalysis measurements. This article will discuss the framework and apply it to a handful of simple but useful sub-components of the larger problem. Subsequent articles will handle more complex aspects of the measurement model. The result will be a framework in which sophisticated and practical models of the uncertainty budget for real- world measurements. It will include many long overlooked contributions like surface roughness and coating thickness. The result provides more than just error bars for our measurements. It also provides a framework for measurement optimization and, ultimately, the development of an expert system to guide both the novice and expert to design more e ective measurement protocols.
Embracing Uncertainty: Modeling Uncertainty in EPMA - Part I, Microscopy and Microanalysis, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=928649
(Accessed December 3, 2023)