Stan, G.
and Cook, R.
(2007),
Effect of topography and multi-asperity contacts on nano-scale elastic property measurements by atomic force acoustic microscopy,, Frontiers of Characterization and Metrology for Nanoelectronics , [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=854372
(Accessed September 10, 2024)
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Effect of topography and multi-asperity contacts on nano-scale elastic property measurements by atomic force acoustic microscopy,
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Frontiers of Characterization and Metrology for Nanoelectronics
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AIP CP931, pages 540-544
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Conferences
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Created September 1, 2007, Updated February 19, 2017