Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Device-Level Experimental Observations of NBTI-Induced Random Timing Jitter



Guangfan Jiao, Jiwu Lu, Jason Campbell, Jason Ryan, Kin P. Cheung, Chadwin D. Young, Gennadi Bersuker


This work utilizes device-level eye-diagram measurements to examine NBTI-induced changes in timing jitter at circuit speeds. The measured jitter is examined for a variety of ring-oscillator and pseudo-random gate patterns. The ring-oscillator patterns were chosen to mimic typical NBTI reliability characterizations while the pseudo-random patterns act as an approximation for real world random logic. Our observations indicate that NBTI-induced jitter is gate pattern-dependent and most severe for the pseudo-random case. Collectively, this work strongly suggests that typical NBTI ring-oscillator characterization methods are insensitive to random logic timing jitter.
IEEE Transactions on Device and Materials Reliability


eye-diagram, jitter, NBTI, reliability


Jiao, G. , Lu, J. , Campbell, J. , Ryan, J. , Cheung, K. , Young, C. and Bersuker, G. (2014), Device-Level Experimental Observations of NBTI-Induced Random Timing Jitter, IEEE Transactions on Device and Materials Reliability, [online], (Accessed May 30, 2024)


If you have any questions about this publication or are having problems accessing it, please contact

Created December 12, 2014, Updated October 12, 2021