TY  - JOUR
AU  - Guangfan Jiao
AU  - Jiwu Lu
AU  - Jason Campbell
AU  - Jason Ryan
AU  - Kin Cheung
AU  - Chadwin Young
AU  - Gennadi Bersuker
C2  - IEEE Transactions on Device and Materials Reliability
DA  - 2014-12-13 00:12:00
LA  - en
PB  - IEEE Transactions on Device and Materials Reliability
PY  - 2014
TI  - Device-Level Experimental Observations of NBTI-Induced Random Timing Jitter
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=916021
ER  -