@article{817396,
  author = {Guangfan Jiao and Jiwu Lu and Jason Campbell and Jason Ryan and Kin Cheung and Chadwin Young and Gennadi Bersuker},
  title = {Device-Level Experimental Observations of NBTI-Induced Random Timing Jitter},
  year = {2014},
  month = {2014-12-13 00:12:00},
  publisher = {IEEE Transactions on Device and Materials Reliability},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=916021},
  language = {en},
}