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Demonstration of a Wafer-level Hall-Mobility Measurement Technique

Published

Author(s)

Liangchun (. Yu, Kin P. Cheung, Vinayak Tilak, Greg Dunne, Kevin Matocha, Jason P. Campbell, John S. Suehle, Kuang Sheng

Citation

Yu, L. , Cheung, K. , Tilak, V. , Dunne, G. , Matocha, K. , Campbell, J. , Suehle, J. and Sheng, K. (2009), Demonstration of a Wafer-level Hall-Mobility Measurement Technique, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=905433 (Accessed February 26, 2024)
Created December 3, 2009, Updated February 19, 2017