TY  - HEAR
AU  - Liangchun Yu
AU  - Kin Cheung
AU  - Vinayak Tilak
AU  - Greg Dunne
AU  - Kevin Matocha
AU  - Jason Campbell
AU  - John Suehle
AU  - Kuang Sheng
DA  - 2009-12-03
LA  - en
PY  - 2009
TI  - Demonstration of a Wafer-level Hall-Mobility Measurement Technique
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=905433
ER  -