Buehler, M.
(1976),
Defects in PN junctions and MOS capacitors observed using thermally stimulated current and capacitance measurements-videotape script:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.SP.400-26
(Accessed March 13, 2025)
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Defects in PN junctions and MOS capacitors observed using thermally stimulated current and capacitance measurements-videotape script:
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- NBS SP 400-26
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NBS SP 400-26
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NIST Pubs
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Created January 1, 1976, Updated May 19, 2023