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Defects in PN junctions and MOS capacitors observed using thermally stimulated current and capacitance measurements-videotape script:

Published

Author(s)

Martin G Buehler
Citation
- NBS SP 400-26
Report Number
NBS SP 400-26

Citation

Buehler, M. (1976), Defects in PN junctions and MOS capacitors observed using thermally stimulated current and capacitance measurements-videotape script:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.SP.400-26 (Accessed March 1, 2024)
Created January 1, 1976, Updated May 19, 2023