@misc{1161916,
  author = {Martin G Buehler},
  title = {Defects in PN junctions and MOS capacitors observed using thermally stimulated current and capacitance measurements-videotape script:},
  year = {1976},
  month = {1976-01-01 05:01:00},
  publisher = {, National Institute of Standards and Technology, Gaithersburg, MD},
  doi = {https://doi.org/10.6028/NBS.SP.400-26},
  language = {en},
}