TY - GEN AU - Buehler, Martin G C2 - , National Institute of Standards and Technology, Gaithersburg, MD DA - 1976-01-01 05:01:00 DO - https://doi.org/10.6028/NBS.SP.400-26 LA - en PB - , National Institute of Standards and Technology, Gaithersburg, MD PY - 1976 TI - Defects in PN junctions and MOS capacitors observed using thermally stimulated current and capacitance measurements-videotape script: ER -