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Chemical Imaging Beyond the Diffraction Limit: Experimental Validation of the PTIR Technique

Published

Author(s)

Basudev Lahiri, Glenn Holland, Andrea Centrone

Abstract

Photo Thermal Induced Resonance (PTIR), recently attracted great interest for enabling chemical identification and imaging with nanoscale resolution. In this work, electron beam nano-patterned polymer samples were fabricated directly on 3-dimentional zinc selenide prisms and used to experimentally evaluate the PTIR lateral resolution, sensitivity and linearity. Experiments prove that PTIR can be used for quantitative chemical analysis at the nanoscale for samples up to 1 µm thick (linearity limit). The analysis of thicker samples provides the first evidence that the previously developed PTIR theory is correct.
Citation
Small
Volume
9
Issue
3

Keywords

Infrared Spectroscopy, Chemical Imaging, Nanoscale Characterization, AFM, Electron Beam Lithography.

Citation

Lahiri, B. , Holland, G. and Centrone, A. (2013), Chemical Imaging Beyond the Diffraction Limit: Experimental Validation of the PTIR Technique, Small, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=911012 (Accessed May 28, 2024)

Issues

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Created February 10, 2013, Updated October 12, 2021