Berning, D.
(1991),
An Automated Reverse-Bias Second-Breakdown Transistor Tester, Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
(Accessed December 15, 2024)
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An Automated Reverse-Bias Second-Breakdown Transistor Tester
Published
Author(s)
Citation
Journal of Research (NIST JRES) -
Volume
96
Issue
3
NIST Pub Series
Pub Type
NIST Pubs
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created June 1, 1991, Updated February 17, 2017