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An Automated Reverse-Bias Second-Breakdown Transistor Tester

Published

Author(s)

David W. Berning
Citation
Journal of Research (NIST JRES) -
Volume
96
Issue
3

Citation

Berning, D. (1991), An Automated Reverse-Bias Second-Breakdown Transistor Tester, Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD (Accessed July 23, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created June 1, 1991, Updated February 17, 2017