TY  - GEN
AU  - David Berning
C2  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1991-06-01
LA  - en
M1  - 96
PB  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1991
TI  - An Automated Reverse-Bias Second-Breakdown Transistor Tester
ER  -