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Websites

Characterization of Fracture Origins in Advanced Ceramic Materials

May 1, 1998

Author(s)

George D. Quinn, J Swab, E F. Begley

This NIST web site will complement ASTM standard C1322-96, Standard Practice for Fractography and Characterization of Fracture Origins in Advanced Ceramics. The...

Ultrasonic Characterization in Advanced Processing of Ceramic Powders

May 1, 1998

Author(s)

Vincent A. Hackley

A world wide web (www) site focussing on NIST efforts in ultrasonic applications development for ceramic processing in fluid-based systems. This site contains...

Photon Physics Home Page

May 1, 1998

Author(s)

Uwe Arp, Charles S. Tarrio

The principal research activities of the Photon Physics Group are in the far ultraviolet and extreme ultraviolet [EUV] physics. In particular, we are currently...

USAXS Studies of Silica Fume Additives in Cements and Concrete

April 1, 1998

Author(s)

Andrew J. Allen, Richard A. Livingston

Supplementary cementitious materials like silica fume, which are added to the cement mix and react with calcium ions in the pore solution, enhance the...

Growth and Analysis of Near Ideal Thin Films and Multilayers

February 18, 1998

Author(s)

J Pedulla, R Deslattes, S Owens

As thin film technology moves into the truly nano-scale region [

NIST Global Positioning System (GPS) Data Archive

January 1, 1998

Author(s)

Michael A. Lombardi

Optical computer aided tomography for plasma uniformity measurements

January 1, 1998

Author(s)

Eric C. Benck, J R. Roberts

Ground Levels and Ionization Energies for the Neutral Atoms

January 1, 1998

Author(s)

William C. Martin, Arlene Musgrove

Atomic Spectral Line Broadening Bibliographic Database

January 1, 1998

Author(s)

Jeffrey R. Fuhr, H R. Felrice

Atomic Spectral Line Broadening Bibliographic Database (version 1.0)

January 1, 1998

Author(s)

Jeffrey R. Fuhr, H R. Felrice, Karen J. Olsen

NIST Physics Laboratory WWW page

January 1, 1998

Author(s)

J S. Coursey, Robert A. Dragoset, Peter J. Mohr, Karen J. Olsen, Edward B. Saloman, G G. Wiersma, M A. Zucker

Performing Measurements of Surface Structures With the Calibrated Atomic Force Microscope

January 1, 1998

Author(s)

R Koning, Ronald G. Dixson, Joseph Fu, V W. Tsai, Theodore V. Vorburger

The use of the atomic force microscope (AFM) to characterize surface structures for industrial applications is rapidly increasing. To compare the results...