Pedulla, J.
, Deslattes, R.
and Owens, S.
(1998),
Growth and Analysis of Near Ideal Thin Films and Multilayers, Growth and Analysis of Near Ideal Thin Films and Multilayers, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=822528, http://www.nist.gov/sigmaxi/Posters98/abs/Owens.html
(Accessed October 7, 2024)
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Growth and Analysis of Near Ideal Thin Films and Multilayers
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, , S Owens
Abstract
As thin film technology moves into the truly nano-scale region [Citation
Growth and Analysis of Near Ideal Thin Films and Multilayers
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Keywords
grazing incidence x-ray scattering GIXS, thin film technology
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Created February 18, 1998, Updated February 19, 2017