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NIST Pubs

Perspectives on the Needs for Biomedical Materials and Device Standards

January 1, 2001

Author(s)

Lisa R. Karam, D S. Hall, J A. Tesk

Needs for Radioactivity Standards and Measurements in Different Fields, ed. by D.R. Lide

January 1, 2001

Author(s)

Bert M. Coursey

Atomic Energy Levels and Other Spectroscopic Data

January 1, 2001

Author(s)

Wolfgang L. Wiese

CODATA Recommended Values of the Fundamental Constants of Physics and Chemistry

January 1, 2001

Author(s)

Peter J. Mohr, Barry N. Taylor

CODATA Recommended Values of the Fundamental Constants of Physics and Chemistry

January 1, 2001

Author(s)

Peter J. Mohr, Barry N. Taylor

Connecting Visible Wavelength Standards with X-Rays and γ;-Rays, ed. by D.R. Lide

January 1, 2001

Author(s)

R Deslattes

Detailed New Tabulation of Atomic Form Factors and Attenuation Coefficients in the Near-Edge Soft X-Ray Regime (Z=30-36, Z=60-89, 3+0.1 keV-8 keV)

January 1, 2001

Author(s)

Christopher T. Chantler

The Calculation of Rotational Energy Levels and Rotational Line Intensities in Diatomic Molecules

January 1, 2001

Author(s)

Jon T. Hougen, G G. Wiersma

Procedures are described, in this pedagogical monograph, for making quantum mechanical calculations of rotational energy levels and rotational line intensities

The International System of Units (SI) 2001 Edition

January 1, 2001

Author(s)

Barry N. Taylor

CODATA Recommended Values of the Fundamental Constants of Physics and Chemistry,

January 1, 2001

Author(s)

Peter J. Mohr, Barry N. Taylor

CODATA Recommended Values of the Fundamental Constants of Physics and Chemistry,

January 1, 2001

Author(s)

Peter J. Mohr, Barry N. Taylor

Periodic Table: Atomic Properties of the Elements, Version 2

January 1, 2001

Author(s)

Robert A. Dragoset, Arlene Musgrove, Charles W. Clark, William C. Martin

Digital Cinema 2001, Conference Proceedings

January 1, 2001

Author(s)

Charles D. Fenimore, M M. Floyd

This Proceeding provides papers and slides for the presentations at digital Cinema 2001 Conference. The conference addresses a variety of business and technical

A Phase-Field Model for High Anisotropic InterfaciEnergy

January 1, 2001

Author(s)

Geoffrey B. McFadden, J J. Eggleston, P W. Voorhees

A computationally efficient phase-field model is developed for two-phase systems with anisotropic interfacial energy. The approach allows for anisotropies

Statistics and Measurements

January 1, 2001

Author(s)

C M. Croarkin

For more than 50 years, the Statistical Engineering Division (SED) has been instrumental in the success of a broad spectrum of metrology projects at NBS/NIST

Common Biometric Exchange File Format (CBEFF)

January 1, 2001

Author(s)

Fernando L. Podio, J S. Dunn, L Reinert, C J. Tilton, L O'Gorman, P Collier, Mark Jerde, B Wirtz

Common Biometric Exchange File Format (CBEFF) describes a set of data elements necessary to support biometric technologies in a common way. These data can be

Thermal Spray Process Reliability: Sensors and Diagnostics; Summary of a Workshop held at National Institute of Standards and Technology

January 1, 2001

Author(s)

Stephen D. Ridder

This report covers the second workshop on TS coatings sponsored by the NIST Metallurgy Division. The first of these workshops, held in November, 1998, is

Guide to Rheological Nomenclature: Measurement in Ceramic Particulate Systems

January 1, 2001

Author(s)

Vincent A. Hackley, Chiara F. Ferraris

This document provides definitions of terms and expressions relating to the measurement of rheological properties in liquid-based ceramic particulate systems (i

Metallurgy Division 2000 Programs and Accomplishments

January 1, 2001

Author(s)

C A. Handwerker, Robert J. Schaefer

This report describes major programs and accomplishments of the Metallurgy Division of the NIST Materials Science and Engineering Laboratory (MSEL) in FY2000

Materials Reliability Division FY 2000 Programs and Accomplishments

January 1, 2001

Author(s)

F R. Fickett

The technical activities of the Materials Reliability Division during fiscal year 2000 are summarized. The Division has 23 research projects in the following

Ceramics Division FY 2000 Programs and Accomplishments

January 1, 2001

Author(s)

Stephen W. Freiman, S J. Dapkunas

The mission of the Ceramics Division is: Work with industry, standards bodies, academia, and other government agencies in providing the leadership for the

Combinatorial Methods at NIST

January 1, 2001

Author(s)

Alamgir Karim, Eric J. Amis

New, more complex materials are increasingly in demand for applications in biotechnology, microelectronics and nanotechnology. The use of combinatorial methods

1998 CODATA Recommended Values of the Fundamental Constants of Physics and Chemistry [Wallet Card]

January 1, 2001

Author(s)

Peter J. Mohr, Barry N. Taylor

This publication is a plastic wallet card listing the 1998 self-consistent set of values of the basic constants and conversion factors of physics and chemistry

1998 CODATA Recommended Values of the Fundamental Constants of Physics and Chemistry [Poster]

January 1, 2001

Author(s)

Peter J. Mohr, Barry N. Taylor

This publication is a large wall chart listing the 1998 self-consistent set of values of the basic constants and conversion factors of physics and chemistry

1998 CODATA Recommended Values of the Fundamental Constants of Physics and Chemistry [Wall Chart]

January 1, 2001

Author(s)

Peter J. Mohr, Barry N. Taylor

This publication is a small wall chart listing the 1998 self-consistent set of values of the basic constants and conversion factors of physics and chemistry

The Candela and Photometric and Radiometric Measurements

January 1, 2001

Author(s)

Albert C. Parr

The national measurement system for photometric and radiometric quantities is presently based upon techniques and a measurement chain that make these quantities

The Kelvin and Temperature Measurements

January 1, 2001

Author(s)

Billy W. Mangum, G T. Furukawa, Kenneth G. Kreider, Christopher W. Meyer, Dean C. Ripple, Gregory F. Strouse, Weston L. Tew, Robert D. Saunders, Bettye C. Johnson, Howard W. Yoon, Michael R. Moldover, Charles E. Gibson

The International Temperature Scale of 1990 (ITS90) is defined from 0.65 K upwards to the highest temperature measurable by spectral radiation thermometry, the

Workshop on Temperature Measurement of Semiconductor Wafers Using Thermocouples

January 1, 2001

Author(s)

Kenneth G. Kreider, D P. DeWitt, Benjamin K. Tsai, B Lojek

Temperature measurement is an important parameter in most semiconductor processes. These measurements are necessary in temperature ranges as low as below 0 C in

Semiconductor Electronics Division Programs, Activities, and Accomplishments 2000

January 1, 2001

Author(s)

Erik M. Secula

This document represents the fiscal year 2000 production of the Projects comprising the Semiconductor Electronics Division (SED). Project goals, customer needs

Office of Law Enforcement Standards - Programs, Activities, and Accomplishments

January 1, 2001

Author(s)

Thomas J. Russell

The Office of Law Enforcements (OLES) of the National Institute of Standards and Technology (NIST) helps law enforcement and criminal justice agencies ensure

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