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NIST Pubs

Office of Law Enforcement Standards - Programs, Activities, and Accomplishments

January 1, 2001

Author(s)

Thomas J. Russell

The Office of Law Enforcements (OLES) of the National Institute of Standards and Technology (NIST) helps law enforcement and criminal justice agencies ensure

Resonance Tunneling of Field Emitted Electrons Through Adsorbates on Metal Surfaces

January 1, 2001

Author(s)

John William Gadzuk

The NBS involvement in the development of single atom electron spectroscopy at surfaces, as realized in field emission resonance tunneling and reported in the

Calibration of X-Ray and Gamma-Ray Measuring Instruments

January 1, 2001

Author(s)

P J. Lamperti, M O'brien

Statistics and Measurements

January 1, 2001

Author(s)

C M. Croarkin

For more than 50 years, the Statistical Engineering Division (SED) has been instrumental in the success of a broad spectrum of metrology projects at NBS/NIST

NIST Mechanisms for Disseminating Measurements

January 1, 2001

Author(s)

T E. Gills, S Dittmann, Georgia L. Harris, C S. Brickenkamp, J R. Rumble, N M. Trahey

The National Bureau of Standards, predecessor of the National Institute of Standards and Technology, began providing the Nation with measurement artifacts and

Opto-mechanical and electronic design of a tunnel-trap Si-radiometer

January 1, 2001

Author(s)

George P. Eppeldauer, D C. Lynch

Therapeutic and Drug Delivery Devices

January 1, 2001

Author(s)

Lisa R. Karam, M Coursey b

Common Biometric Exchange File Format (CBEFF)

January 1, 2001

Author(s)

Fernando L. Podio, J S. Dunn, L Reinert, C J. Tilton, L O'Gorman, P Collier, Mark Jerde, B Wirtz

Common Biometric Exchange File Format (CBEFF) describes a set of data elements necessary to support biometric technologies in a common way. These data can be

Acceptance of new batches of 9310 steel for the Charpy Machine Verification Program

January 1, 2001

Author(s)

May Ling Martin, Enrico Lucon

During FY2021, one of the NIST Charpy Contractors returned some 9310 steel blanks (rough-machined, oversized, unnotched specimens) that presented visible black

Limits for Qualitative Detection and Quantitative Determination in A Century of Excellence in Measurements, Standards, and Technology - A Chronicle of Selected NBS/NIST Publications, 1901-2000

January 1, 2001

Author(s)

Richard M. Lindstrom

Perspectives on the Needs for Biomedical Materials and Device Standards

January 1, 2001

Author(s)

Lisa R. Karam, D S. Hall, J A. Tesk

Thermal Spray Process Reliability: Sensors and Diagnostics; Summary of a Workshop held at National Institute of Standards and Technology

January 1, 2001

Author(s)

Stephen D. Ridder

This report covers the second workshop on TS coatings sponsored by the NIST Metallurgy Division. The first of these workshops, held in November, 1998, is

The Ampere and Electrical Standards

January 1, 2001

Author(s)

Randolph Elmquist, Marvin E. Cage, Yi-hua D. Tang, Anne-Marie Jeffery, Joseph R. Kinard Jr., Ronald F. Dziuba, Nile M. Oldham, Edwin R. Williams

This paper describes some of the major contributions to metrology and physics made by the NIST Electricity Division, which has existed since 1901. It was one of

Electron Interactions with c-C₄F₈

January 1, 2001

Author(s)

Loucas G. Christophorou, James K. Olthoff

The limited electron collision cross-section and transport-coefficient data for the plasma processing gas perfluorocyclobutane (c-C 4F 8) are synthesized

NIST Centenial Sessions August Second Two Thousand and One

January 1, 2001

Author(s)

W Anderson, Dennis A. Swyt, H Semerjian

The National Conference of Standards Laboratories International was formed in forty years ago (as NCSL) to promote cooperative efforts for solving the common

Transfer Calibration Validation Tests on a Heat Flux Sensor in the 51 mm High-Temperature Blackbody

January 1, 2001

Author(s)

A V. Murthy, Benjamin K. Tsai, Robert D. Saunders

Wafer Level Underfill: Experiments and Modeling.

January 1, 2001

Author(s)

Daniel Josell, William E. Wallace, Daniel Wheeler

MSIDs Continuous Improvement Activities

January 1, 2001

Author(s)

Sharon J. Kemmerer, Kristy D. Thompson

The purpose of this document is to provide status on two continuous improvement projects internal to the National Institute of Standards and Technology (NIST)

Submicrometer Linewidth Metrology

January 1, 2001

Author(s)

Michael T. Postek, Robert D. Larrabee

Office of Microelectronics Programs Technical Accomplishments

January 1, 2001

Author(s)

Stephen Knight, Barbara J. Belzer

This document represents the fiscal year 2000 production of the Programs comprising the Office of Microelectronics Programs (OMP).

A Pratical Josephson Voltage Standard at One Volt

January 1, 2001

Author(s)

Yi-hua D. Tang, Norman B. Belecki, J F. Mayo-Wells

Computational and Performance Aspects of PCA-Based Face Recognition Algorithms

January 1, 2001

Author(s)

H Moon, P. Jonathon Phillips

Principal component analysis (PCA) based algorithms form the basis of numerous algorithms and studies in the psychological and algorithmic face recognition

Rationale and Procedures for Development of a NASA Primary Metrology Laboratory for Large Optics

January 1, 2001

Author(s)

Theodore V. Vorburger, Christopher J. Evans, William T. Estler

Traceable optics metrology is not an expensive overhead. Rather it can improve NASA''s procurement process and eliminate costly Hubble-like mistakes. In

Electronics and Electrical Engineering Laboratory, Magnetics Group: Programs, Activities, and Accomplishments

December 31, 2000

Author(s)

Ronald B. Goldfarb

Report of the NIST MEL Architecture Task Force

December 29, 2000

Author(s)

Harry A. Scott, John Evans, Steven R. Ray, E C. Teague, James S. Albus, Herbert T. Bandy, Edward J. Barkmeyer Jr., Neil Christopher, M A. Donmez, Hui-Min Huang, Albert W. Jones, Elena R. Messina, Jim G. Nell, Frederick M. Proctor, Evan K. Wallace

The NIST Manufacturing Engineering Laboratory undertook a series of internal working meetings to examine all of its architecture efforts. A survey of work was

A Statistical Test Suite for Random and Pseudorandom Number Generators for Cryptographic Applications

December 20, 2000

Author(s)

Elaine B. Barker

Random and pseudorandom numbers are needed for many cryptographic applications. For example, common cryptosystems employ keys that must be generated in a random

Molecular Dynamics Study of Liquids in Contact with Tethered Chains

December 13, 2000

Author(s)

Raymond D. Mountain

The results of a series of molecular dynamics simulationss of long chain molecules in contact with a surface, with water films, and with water-acetonitrile

Experimental Thermal Conductivity Values for the IUPAC Round-Robin Sample of 1,1,1,2-Tetrafluoroethane (R134a)

December 1, 2000

Author(s)

Richard A. Perkins, Arno D. Laesecke, J -. Howley, M L. Ramires, A N. Gurova, L -. Cusco

Experimental measurements are reported for the thermal conductivity of 1,1,1,2-tetrafluoroethane (R134a). These measurements were obtained with transient and

Interferometric Metrology of Photomask Blanks: Approaches Using 633 nm Wavelength Illumination

December 1, 2000

Author(s)

Christopher J. Evans, R E. Parks, L Z. Shao, Angela Davies

Preliminary analyses of three optical configurations for measurement of photomask blanks are described. A simple variant of the well known Ritchey-Common test

A Bibliography of Publications of the NIST Electromagnetic Technology Division

December 1, 2000

Author(s)

Sara E. Metz

This bibliography lists the publications of the staff of the Electromagnetic Technology Division of NIST during the period from January, 1970 through July, 1999

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